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Negative bias temperature instability (NBTI) preconditioning of matched devices

  • US 7,177,201 B1
  • Filed: 09/17/2003
  • Issued: 02/13/2007
  • Est. Priority Date: 09/17/2003
  • Status: Active Grant
First Claim
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1. A method of compensating for accumulated data-dependent post-manufacture shift in a characteristic of one or more of a pair of matched devices within an integrated circuit, said shift giving rise to a mismatch in the characteristic between the pair of matched devices, the method comprising:

  • preconditioning the matched devices to cause an initial shift in the characteristic in each of the matched devices and to thereby reduce an expected magnitude of any further lifetime shift in the characteristic of either matched device.

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