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Reduction of false alarms in PCB inspection

  • US 7,177,458 B1
  • Filed: 09/10/2000
  • Issued: 02/13/2007
  • Est. Priority Date: 09/10/2000
  • Status: Expired due to Fees
First Claim
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1. A method for automatically optically inspecting an electrical circuit, comprising:

  • acquiring at least one non-binary optical image of an electrical circuit;

    generating at least one binary first inspection image from the at least one non-binary optical image and processing said binary first inspection image to determine therefrom regions of candidate defects in the electrical circuit;

    generating at least one additional inspection image, from said at least one non-binary optical image, for regions surrounding candidate defects, said at least one additional inspection image at least partially including information for an optical characteristic that is not included in the at least one binary first inspection image; and

    determining whether the candidate defect is a specious defect by inspecting the at least one additional inspection image.

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