Device for testing smart card and method of testing the smart card

• US 7,181,665 B2
• Filed: 08/05/2004
• Issued: 02/20/2007
• Est. Priority Date: 08/05/2003
• Status: Expired due to Fees

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Son, Won-Woo
• Primary Examiner(s): Ton; David
• Application Number:
  US10/912,006
• Publication Number:
  US 20050034028A1
• Time in Patent Office: 929 Days
• Field of Search: 235/492, 235/438, 324/158.1, 714/724, 714/738, 714/742, 714/739
• US Class Current: 714/742
• CPC Class Codes: G06K 7/0008 General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer
• CPC Class Codes: G06K 7/0095 Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly testing of electrical circuits G01R31/28
• CPC Class Codes: G06K 7/10465 the interrogation device being capable of self-diagnosis, e.g. in addition to or as part of the actual interrogation process testing of electrical circuits in general G01R31/28

Abstract

Devices and methods are provided for testing various types of smart cards including contact, contactless, and hybrid type (contact/contactless) smart cards. A test device includes a logic tester, a contactless interface unit, and a contact interface unit. The logic tester generates a test pattern that is transmitted to a smart card to test the smart card and compares a received response pattern with a response pattern to test a status of the smart card. The contactless interface unit enables a contactless test mode of operation and the contact interface unit enables a contact test mode of operation.

Claims

1. A test device for testing a contact type, a contactless type or a contact/contactless hybrid type smart card, the device comprising:

a logic tester which generates a test pattern to test a smart card, and which compares a received response pattern from the smart card with a predetermined response pattern to determine a status of the smart card;

a contactless interface unit that modulates the test pattern onto a carrier signal to transmit the modulated signal to the smart card, demodulates a sub-carrier signal received fom the smart card to restore the response pattern, and provides the logic tester with the response pattern, when the logic tester operates in a contactless test mode; and

a contact interface unit which transmits the test pattern received from the logic tester to the smart card over a wired connection, and which provides the logic tester with the response pattern, when the logic tester operates in a contact test mode,

wherein the contactless interface unit comprises;

a logic interface that receives a clock signal, a peak-to-peak voltage signal, a modulation index, and logic data from the logic tester;

an antenna;

a transmitting unit that generates the carrier signal using the clock signal and the peak-to-peak voltage signal, and modulates the logic data based on the modulation index to transmit the modulated logic data via the antenna; and

a receiving unit that demodulates the sub-carrier signal received from the antenna, and restores the response pattern to provide the logic interface with the restored response pattern.

2. The device of claim 1, wherein the transmitting unit comprises:

a carrier oscillator that generates the carrier signal having a same amplitude as the peak-to-peak voltage and having a frequency, wherein the carrier signal is synchronized with the clock signal;

a modulator that modulates the logic data based on the modulation index onto the carrier signal;

a filter that filters an output of the modulator; and

an amplifier that amplifies an output of the filter to transmit the amplified signal via the antenna.

3. The device of claim 1, wherein the receiving unit comprises:

a detector that demodulates the sub-carrier signal to detect data; and

a converter that converts the detected data into the logic data.

4. The device of claim 1, wherein the logic tester comprises:

a pattern generator that generates the test pattern in response to a first control signal;

a first switch that selects the contactless interface unit or the contact interface unit in response to a second control signal;

a pattern comparator that compares the response pattern with the predetermined response pattern to test a status of the smart card;

a second switch that selects a first response pattern received from the contactless interface unit or a second response pattern received from the contact interface unit in response to a third control signal to provide the pattern comparator with the selected response pattern; and

a processor that generates the first, second and third control signals to control a testing procedure.

5. A test device for testing a smart card, comprising:

a logic test circuit which generates a test pattern for testing a smart card, and which processes a response pattern received from the smart card in response to the test pattern to determine a status of the smart card;

a contactless interface unit comprising a transmitter and a receiver for wirelessly transmitting a test pattern and a response pattern between the logic test circuit and the smart card, when the logic test circuit operates in a contactless test mode; and

a contact interface unit for transmitting a test pattern and a response pattern between the logic test circuit and the smart card over a wired connection, when the logic test circuit operates in a contact test mode,

wherein the logic test circuit comprises;

a processor;

a pattern generator that generates the test pattern in response to a first control signal generated by the processor; and

a pattern comparator that compares the response pattern with a predetermined response pattern to test the status of the smart card;

a first switch that couples the output of the pattern generator to the contactless interface unit or the contact interface unit under control of the processor; and

a second switch that couples the input of the pattern comparator to the contactless interface unit or the contact interface unit under control of the processor.

6. The test device of claim 5, wherein the transmitter comprises an oscillator that generates a carrier signal, and a modulator that generates a modulated signal modulating the carrier signal with logic data of a test pattern, and transmits the modulated signal to the smart card.

7. The test device of claim 6, wherein the logic test circuit comprises:

a processor that generates a modulation index;

a clock generator that generates a clock signal; and

a voltage generator that generates a VPP (peak-to-peak voltage) signal, wherein the oscillator generates the carrier signal based on the VPP signal and clock signal, and wherein the modulator encodes the logic data of the test pattern based on the modulation index.

8. The test device of claim 6, wherein the transmitter further comprises:

a filter to filter an output of the modulator; and

an amplifier to amplify an output of the filter.

9. The test device of claim 5, wherein the receiver comprises:

a detector that demodulates the sub-carrier signal to detect data; and

a converter that converts the detected data into logic data of a response pattern.

10. A method of testing a smart card, the method comprising:

generating a test pattern;

selecting a contact test mode or a contactless test mode;

when a contactless test mode is selected, generating a modulation index, generating a clock signal;

generating a VPP (peak-to-peak voltage) signal;

generating a carrier signal based on the VPP signal and clock signal modulating the carrier signal with logic data of the test pattern based on the modulation index to generate a modulated signal;

transmitting the modulated signal to a smart card;

demodulating a sub-carrier signal received from the smart card to restore a response pattern; and

comparing the response pattern and a predetermined response pattern; and

displaying a contactless test mode result based on results of comparing the response pattern and the predetermined response pattern; and

when a contact test mode is selected, transmitting the test pattern to a smart card via a physical contact terminal;

comparing a response pattern received from the smart card with a predetermined response pattern; and

displaying a contact test mode result based on results of comparing the response pattern and the predetermined response pattern.