Prioritizing of nets for coupled noise analysis
First Claim
1. A method of performing microelectronic chip timing analysis, said method comprising:
- identifying failing timing paths in a chip;
prioritizing said failing timing paths in said chip according to a size of random noise events occurring in each timing path, wherein said prioritizing of said failing timing paths in said chip comprises sorting a timing impact of random noise events occurring in said chip by an occurrence of an event and a probability that said event will occur;
attributing a timing value for all random noise events occurring in each timing path except for a statistically determined number of the largest random noise events occurring in each timing path;
calculating a worst case timing path in said chin based on the prioritized failing timing paths and said timing value; and
correcting only a portion of said chip comprising said worst cast timing path.
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Abstract
A system and method of performing microelectronic chip timing analysis, wherein the method comprises identifying failing timing paths in a chip; prioritizing the failing timing paths in the chip according to a size of random noise events occurring in each timing path; attributing a slack credit statistic for all but highest order random noise events occurring in each timing path; and calculating a worst case timing path scenario based on the prioritized failing timing paths and the slack credit statistic. Preferably, the random noise events comprise non-clock events. Moreover, the random noise events may comprise victim/aggressor net groups belonging to different regularity groups. Preferably, the size of random noise events comprises coupled noise delta delays due to the random noise events occurring in the chip.
72 Citations
20 Claims
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1. A method of performing microelectronic chip timing analysis, said method comprising:
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identifying failing timing paths in a chip; prioritizing said failing timing paths in said chip according to a size of random noise events occurring in each timing path, wherein said prioritizing of said failing timing paths in said chip comprises sorting a timing impact of random noise events occurring in said chip by an occurrence of an event and a probability that said event will occur; attributing a timing value for all random noise events occurring in each timing path except for a statistically determined number of the largest random noise events occurring in each timing path; calculating a worst case timing path in said chin based on the prioritized failing timing paths and said timing value; and correcting only a portion of said chip comprising said worst cast timing path. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A program storage device readable by computer, tangibly embodying a program of instructions executable by said computer to perform a method of performing microelectronic chip timing analysis, said method comprising:
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identifying failing timing paths in a chip; prioritizing said failing timing paths in said chip according to a size of random noise events occurring in each timing path, wherein said prioritizing of said failing timing paths in said chip comprises sorting a timing impact of random noise events occurring in said chip by an occurrence of an event and a probability that said event will occur; attributing a timing value for all random noise events occurring in each timing path except for a statistically determined number of the largest random noise events occurring in each timing path; calculating a worst case timing path in said chip based on the prioritized failing timing paths and said timing value; and correcting only a portion of said chip comprising said worst cast timing path. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A system for performing microelectronic chip timing analysis, said system comprising:
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a simulator adapted to identify failing timing paths in a chip; a processor connected to said simulator, said processor being adapted to; prioritize said failing timing paths in said chip according to a size of random noise events occurring in each timing path, and sort a timing impact of said random noise events occurring in said chip by an occurrence of an event and a probability that said event will occur; an analyzer connected to said processor, said analyzer being adapted to attribute a timing value for all random noise events occurring in each timing path except for a statistically determined number of the largest random noise events occuring in each timing path; a calculator connected to said processor and said analyzer, said calculator being adapted to calculate a worst case timing path in said chip based on the prioritized failing timing paths and said timing value, wherein said worst case timing path indicates the portion of said chip to be corrected. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification