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Semiconductor device, semiconductor device testing method, and programming method

  • US 7,184,338 B2
  • Filed: 08/30/2005
  • Issued: 02/27/2007
  • Est. Priority Date: 08/30/2004
  • Status: Expired due to Fees
First Claim
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1. A semiconductor device comprising:

  • a latch circuit that latches a given signal in a test mode; and

    a generating circuit that generates a signal that defines a pulse width of a program voltage used for programming of a memory cell in accordance with the signal latched in the latch circuit.

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