Area-change sensing through capacitive techniques
First Claim
1. An apparatus comprising:
- a first conductive surface substantially parallel to a second conductive surface and moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface;
a processing module to detect an overlap area between the first conductive surface and the second conductive surface and to generate a measurement based on a position of the first conductive surface relative to the second conductive surface; and
a reference surface substantially parallel to the first conductive surface and the second conductive surface, the reference surface coupled to at least one of the first conductive surface and the second conductive surface.
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Accused Products
Abstract
An area-change sensing through capacitive techniques is disclosed. In one embodiment, a first conductive surface is substantially parallel to a second conductive surface. The first conductive surface may be moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface. A processing module may detect an overlap area between the first conductive surface and the second conductive surface. In addition, a reference surface may be substantially parallel to the first conductive surface and the second conductive surface. The processing module may be configured to measure a reference capacitance between the reference surface and a selected surface of the first conductive surface and the second conductive surface. The processing module may apply an algorithm that considers the reference capacitance and converts a change in capacitance between the first conductive surface and the second conductive surface to at least one of a voltage response and a frequency response to determine the measurement.
29 Citations
21 Claims
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1. An apparatus comprising:
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a first conductive surface substantially parallel to a second conductive surface and moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface; a processing module to detect an overlap area between the first conductive surface and the second conductive surface and to generate a measurement based on a position of the first conductive surface relative to the second conductive surface; and a reference surface substantially parallel to the first conductive surface and the second conductive surface, the reference surface coupled to at least one of the first conductive surface and the second conductive surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method, comprising:
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generating a first measurement based on a change in an overlap area of a first conductive surface and a second conductive surface of a variable capacitor, the first conductive surface substantially parallel to the second conductive surface, the first conductive surface moveable relative to the second conductive surface in a direction substantially parallel with the second conductive surface; generating a second measurement based on at least one environmental condition by analyzing data of a reference capacitor, wherein the at least one environmental condition is humidity in a gap between the first conductive surface and the second conductive surface, a temperature of the variable capacitor, and an air pressure of an environment surrounding the variable capacitor; applying the second measurement to the first measurement to produce a measurement; and communicating the measurement to a data processing system associated with the variable capacitor. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21)
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Specification