Method and apparatus for testing circuit boards

• US 7,188,037 B2
• Filed: 08/20/2004
• Issued: 03/06/2007
• Est. Priority Date: 08/20/2004
• Status: Active Grant

• Current Assignee: Microcraft Co.
• Original Assignee: Microcraft Co.
• Inventors: Hidehira, Yorio
• Primary Examiner(s): Nghiem; Michael
• Assistant Examiner(s): VO, HIEN XUAN
• Application Number:
  US10/923,446
• Publication Number:
  US 20060052957A1
• Time in Patent Office: 928 Days
• Field of Search: 702/58, 702/84, 702/57, 324/95, 324/501, 324/750, 324/758, 324/72.5, 714/738
• US Class Current: 702/58
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence

Abstract

The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention includes a transmission unit (2) for transmitting electromagnetic (radio) wave signal by way of an antenna (1) to a circuit board (3) to be tested, a detecting unit (3) for detecting signal received by a conductor path (4) of the circuit board (3) by using the conductor path (4) as a receiving antenna, and compare unit (8) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path (4) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.

Claims

1. Apparatus for testing a circuit board including at least one conductor path, comprising:

a transmission unit having an antenna for transmitting electromagnetic wave signal to the circuit board, wherein said antenna has a loop coil shape, and the circuit board is positioned in the antenna and perpendicular to the magnetic field induced by the electromagnetic wave signal transmitted from the antenna;

a detecting unit for detecting the electromagnetic wave signal received from the conductor path of the circuit board; and

a compare unit for comparing the electromagnetic wave signal received from the conductor path with reference data corresponding to the conductor path so as to detect a defect in the circuit board.

2. The apparatus of claim 1 wherein said loop coil shape is circular shape.

3. The apparatus of claim 1 wherein said loop coil shape is polygonal shape.

4. The apparatus of claim 1 wherein said antenna is a first conductor path provided in the circuit board, a second conductor path provided in the circuit board receives the electromagnetic wave transmitted from the first conductor, and said compare unit compares the electromagnetic wave signal received from the second conductor path with reference data corresponding to the second conductor path so as to detect a defect associated with the second conductor path in the circuit board.

5. The apparatus of claim 1 wherein said detecting unit has a pair of moving metal probes, each of the probes faces each of two opposite surfaces of the circuit board, respectively, and each of the probes moves in parallel with and perpendicular to the circuit board so as to contact a terminal connecting to the conductor path in the circuit board.

6. The apparatus of claim 1 wherein said transmission unit is capable of changing the frequency and/or output power of the electromagnetic wave signal transmitted from the antenna.

7. The apparatus of claim 6 wherein said detecting unit has a receiver circuit capable of tuning to the frequency of electromagnetic wave signal transmitted from the antenna, an amplification circuit for amplifying the electromagnetic wave signal from the receiver circuit, and a demodulation circuit for demodulating and/or detecting the electromagnetic wave signal from the amplification circuit.

8. The apparatus of claim 7 wherein said transmission unit transmits electromagnetic wave signal including a sine wave signal having a predetermined amplitude, said demodulation circuit detects the amplitude of said sine wave signal received from the conductor path relative to said predetermined amplitude, and said compare unit compares the received amplitude with reference data so as to detect a defect.

9. The apparatus of claim 7 wherein said transmission unit transmits electromagnetic wave signal including a sine wave signal having a predetermined phase in voltage, said demodulation circuit detects phase difference in voltage of said sine wave signal received from the conductor path relative to said predetermined phase, and said compare unit compares the phase difference with reference data so as to detect a defect.

10. The apparatus of claim 7 wherein said transmission unit transmits electromagnetic wave signal including a sine wave signal having a predetermined phase in current, said demodulation circuit detects phase difference in current of said sine wave signal received from the conductor path relative to said predetermined phase, and said compare unit compares the phase difference with reference data so as to detect a defect.

11. The apparatus of claim 7 wherein said transmission unit transmits electromagnetic wave signal including burst signals including a rectangular pulse component having a predetermined timing, said demodulation circuit detects skew or delay of said rectangular pulse component of the burst signals received from the conductor path relative to said predetermined timing, and said compare unit compares the skew or delay with reference data so as to detect a defect.

12. The apparatus of claim 7 wherein said transmission unit transmits electromagnetic wave signal including modulated digital signal having a predetermined timing, said demodulation circuit demodulates the modulated digital signal received from the conductor path and detects skew or delay in signal demodulated from said modulated digital signal relative to said predetermined timing, and said compare unit compares the skew or delay with reference data so as to detect a defect.