Method and apparatus for determining a bidirectional reflectance distribution function, subsurface scattering or a bidirectional texture function of a subject
First Claim
Patent Images
1. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
- a light source for producing light; and
means for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously with the light.
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Accused Products
Abstract
An apparatus for determining a bidirectional reflectance distribution function of a subject. In one embodiment, the apparatus includes a light source for producing light. The apparatus includes means for measuring the bidirectional reflectance distribution function of the subject from multiple locations simultaneously with the light. A method for determining a bidirectional reflectance distribution function of a subject.
70 Citations
26 Claims
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1. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously with the light. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously from more than 1 camera or more than 1 projector. - View Dependent Claims (10, 11)
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12. A method for determining one or more values of a bidirectional reflectance distribution function of a subject comprising the steps of:
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producing light from a light source; and measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject from multiple locations simultaneously with the light.
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13. An apparatus for determining one or more values of a bidirectional texture function of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional texture function of the subject of multiple locations simultaneously with the light. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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21. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously with the light having no moving parts.
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22. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously with the light, the light source and measuring means together being portable and handheld.
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23. An apparatus for determining one or more values of a bidirectional texture function of a subject comprising:
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a light source for producing light; and a measurer for measuring one or more values of the bidirectional texture function of multiple locations of the subject simultaneously with the light.
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24. An apparatus for determining one or more values of a bidirectional reflectance distribution function of a subject comprising:
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a light source for producing light; and a measurer for measuring one or more values of the bidirectional reflectance distribution function of multiple locations of the subject simultaneously with the light. - View Dependent Claims (25)
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26. An apparatus for determining one or more values of a bidirectional reflectance distribution of a subject comprising:
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a light source for producing light; and means for measuring one or more values of the bidirectional reflectance distribution of multiple locations of the subject simultaneously with the light.
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Specification