Methods for finding and characterizing a deformed pattern in an image
DCFirst Claim
1. A method for finding a deformed pattern in an image, the method comprising:
- providing a plurality of features that represent the deformed pattern in the image;
dividing the plurality of features into a plurality of sub-pluralities, each sub-plurality representing a sub-pattern in the image, a plurality of the sub-patterns representing the deformed pattern;
determining a distance between each pair of sub-patterns of the plurality of sub-pluralities;
selecting a first sub-pattern to locate in the image;
locating the first sub-pattern in the image so as to provide a first sub-pattern location;
using the first sub-pattern location to select a second sub-pattern to locate in the image; and
locating the second sub-pattern in the image so as to provide a second sub-pattern location; and
using the first sub-pattern location and the second sub-pattern location to determine a location of the deformed pattern.
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Abstract
A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern. Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn'"'"'t contain information about the pattern'"'"'s distorted location.
71 Citations
22 Claims
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1. A method for finding a deformed pattern in an image, the method comprising:
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providing a plurality of features that represent the deformed pattern in the image; dividing the plurality of features into a plurality of sub-pluralities, each sub-plurality representing a sub-pattern in the image, a plurality of the sub-patterns representing the deformed pattern; determining a distance between each pair of sub-patterns of the plurality of sub-pluralities; selecting a first sub-pattern to locate in the image; locating the first sub-pattern in the image so as to provide a first sub-pattern location; using the first sub-pattern location to select a second sub-pattern to locate in the image; and locating the second sub-pattern in the image so as to provide a second sub-pattern location; and using the first sub-pattern location and the second sub-pattern location to determine a location of the deformed pattern. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification