Optical interferometry
First Claim
1. An apparatus comprising:
- an interferometer to split an input beam into a measurement beam and at least one other beam, to direct the measurement beam along a measurement path that includes at least two passes to a measurement object, to direct the other beam along a reference path that includes at least two passes to a reference object, and to overlap the measurement beam with the other beam after the measurement beam completes the at least two passes, in which the measurment object can be moved relative to the reference object to change a distance between the measurement and reference objects, the path of the measurement beam being sheared during the first and second passes when the measurement object moves; and
one or more optics to redirect the measurement beam after the first pass and before the second pass so that the shear imparted during the second pass cancels the shear imparted during the first pass.
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Accused Products
Abstract
An interferometry system includes an interferometer to split an input beam into a measurement beam and at least one other beam. The interferometer directs the measurement beam along a measurement path that includes at least two passes to a measurement object, and overlaps the measurement beam with the other beam after the measurement beam completes the at least two passes. The path of the measurement beam is sheared during the first and second passes when the measurement object moves along a direction orthogonal to a portion of the measurement path that contacts the measurement object. The interferometry system includes optics to redirect the measurement beam after the first pass and before the second pass so that shear imparted during the second pass cancels shear imparted during the first pass. The optics also redirect the measurement beam after the second pass and before overlapping with the other beam so that the measurement beam propagates in a direction that is constant relative to the propagation direction of the other beam independent of changes in the orientation of the optics.
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Citations
122 Claims
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1. An apparatus comprising:
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an interferometer to split an input beam into a measurement beam and at least one other beam, to direct the measurement beam along a measurement path that includes at least two passes to a measurement object, to direct the other beam along a reference path that includes at least two passes to a reference object, and to overlap the measurement beam with the other beam after the measurement beam completes the at least two passes, in which the measurment object can be moved relative to the reference object to change a distance between the measurement and reference objects, the path of the measurement beam being sheared during the first and second passes when the measurement object moves; and
one or more optics to redirect the measurement beam after the first pass and before the second pass so that the shear imparted during the second pass cancels the shear imparted during the first pass. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 77, 78, 79, 80, 81, 82)
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42. An apparatus comprising:
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an interferometer to split an input beam into a measurement beam and at least one other beam, to direct the measurement beam along a measurement path that includes at least two passes to a measurement object, to direct the other beam toward a reference object, and to overlap the measurement beam with the other beam after the measurement beam completes the at least two passes, in which the measurement object can be moved relative to the reference object to change a distance between the measurement and referance objects; and
one or more optics to redirect the measurement beam after the first pass and before the second pass so that during the second pass, a portion of the measurement path traversed by the measurement beam propagating from the measurement object toward the interferometer remains the same independent of a movement of the measurement object, the one or more optics also to redirect the measurement beam after the second pass and before overlapping with the other beam. - View Dependent Claims (43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53)
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54. An apparatus comprising:
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an interferometer to split an input beam into a measurement beam and at least one other beam, to direct the measurement beam along a measurement path that includes at least two passes to a measurement object, and to overlap the measurement beam with the other beam after the measurement beam completes the at least two passes;
a first optic to redirect the measurement beam after the first pass and before the second pass; and
a second optic to redirect the measurement beam after the second pass and before the measurement beam combines with the other beam, the first and second optics are designed such that when the orientations of the first and second optics are determined, relative beam shear between the measurement beam and the other beam remains the same independent of a movement of the measurement object along a direction that is orthogonal to a portion of the measurement path that is incident on the measurement object during the first pass. - View Dependent Claims (55, 56, 57, 58)
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59. An apparatus comprising:
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an interferometer to split an input beam into a measurement beam and at least one other beam, to direct the measurement beam along a measurement path that includes at least two passes to a cube corner retroreflector having reflection surfaces, and to overlap the measurement beam with the other beam after the measurement beam completes the at least two passes;
an odd number of reflection surfaces to redirect the measurement beam traveling away from the retroreflector after the first pass and before the second pass so that during the second pass, the measurement beam travels toward a reflection surface of the retroreflector that was the last in sequence to be contacted by the measurement beam during the first pass, the odd number being larger than 1; and
a reflection surface to redirect the measurement beam after the second pass and before overlapping with the other beam.
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60. An apparatus comprising:
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an interferometer to split an input beam into at least a first beam and a second beam, to direct the first beam along a first path that reflects from a first object, to direct the second beam along a second path that reflects from a second object, and to overlap the first and second beams after being reflected by the first and second objects, respectively, and portions of the second beam traveling through a region in a direction non-parallel to the direction of the portion of the first beam that is incident on the first object; and
one or more optics to direct portions of the first beam through the region such that a change in the environmental conditions of the region causes equal amounts of change in the optical path lengths of the first and second beams. - View Dependent Claims (61, 62, 63, 64, 65, 66, 67, 68, 69, 70)
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71. An apparatus comprising:
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an interferometer to split an input beam into at least a first beam and a second beam, to direct the first beam along a first path that reflects from a first object, to direct the second beam along a second path that reflects from a second object, and to overlap the first and second beams after being reflected by the first and second objects, respectively, in which the first object can be moved relative to the second object to change a distance between the first and second objects, the first path including two passes to the first object, the first path during the first pass including two portions that contact the first object, the two portions lying along a first plane, the second path including two passes to the second object, the second path during the first pass including two portions that contact the second object, the two portions lying along a second plane, the first path being sheared during the first and second passes when the first object moves along a direction orthogonal to one of the two portions of the first path that contacts the first object; and
one or more optics to redirect the first beam after the first pass and before the second pass so that shear imparted during the second pass cancels shear imparted during the first pass. - View Dependent Claims (72, 73, 74, 75, 76)
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83. An interferometry system for measuring changes in a position of a measurement object, comprising:
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an interferometer to split an input beam into a measurement beam and at least a reference beam, to direct the measurement beam along a measurement path that includes at least two passes to the measurement object, to direct the reference beam to contact a reference object, and to overlap the measurement beam with the reference beam after the measurement beam completes the at least two passes, in which the measurement object can be moved relative to the reference object to change a distance between the measurement and reference objects, the path of the measurement beam being sheared during the first and second passes when the measurement object moves along a first direction or laterally along a second direction that is orthogonal to the first direction; and
one or more optics to redirect the measurement beam after the first pass and before the second pass so that shear imparted during the second pass due to a movement of the measurement object cancels shear imparted during the first pass due to the movement, in which the one or more optics also redirects the measurement beam after the second pass and before overlapping with the reference beam. - View Dependent Claims (84, 85)
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86. A method comprising;
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directing a measurement beam along a measurement path through an interferometer, the measurement path including at least two passes to a measurement object, the path of the measurement beam being sheared during the first and second passes when the measurement object moves;
directing at least one other beam along a reference path through the interferometer, the reference path including at least two passes to a reference object, in which the measurement object can be moved relative to the reference object to change a distance between the measurement and reference objects;
redirecting the measurement beam after the first pass and before the second pass so that shear imparted during the second pass cancels shear imparted during the first pass; and
overlapping the measurement beam with the other beam after the measurement beam completes the at least two passes. - View Dependent Claims (87, 88, 89, 90, 91, 92, 93, 94, 95, 96, 97, 98, 99, 117, 118, 119, 120, 121, 122)
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100. A method comprising:
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directing a measurement beam along a measurement path through an interferometer, the measurement path including at least two passes to a measurement object;
directing at least one other beam along a reference path through the interferometer, reference path including at least two passes to a reference object, in which the measurement object can be moved relative to the reference object to change a distance between the measurement and reference objects;
redirecting the measurement beam after the first pass and before the second pass so that during the second pass, a portion of the measurement path traversed by the measurement beam propagating from the measurement object toward the interferometer remains the same independent of a movement of the measurement object;
redirecting the measurement beam a second time after the measurement beam completes the at least two passes; and
overlapping the measurement beam and the other beam after redirecting the measurement beam the second time. - View Dependent Claims (101, 102, 103)
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104. A method comprising:
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directing a measurement beam along a measurement path through an interferometer, the measurement path including at least two passes to a measurement object;
directing at least one other beam through the interferometer to contact a reference object, in which the measurement object can be moved relative to the reference object to change a distance between the measurement and reference objects;
redirecting the measurement beam after the first pass and before the second pass so that relative beam shear between the measurement path and the other path remains the same independent of a movement of the measurement object; and
redirecting the measurement beam a second time after the measurement beam completes the at least two passes; and
overlapping the measurement beam and the other beam after the measurement beam completes the at least two passes. - View Dependent Claims (105, 106, 107)
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108. A method comprising:
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separating an input beam into a measurement beam and at least one other beam;
directing the measurement beam along a measurement path that includes at least two passes to a cube corner retroreflector having reflection surfaces;
directing the other beam to contact a reference object, in which the retroreflector can be moved relative to the reference object to change a distance between the retroreflector and the reference object;
redirecting the measurement beam traveling away from the retroreflector after the first pass and before the second pass so that during the second pass, the measurement beam travels toward a reflection surface of the retroreflector that was the last in sequence to be contacted by the measurement beam during the first pass;
redirecting the measurement beam a second time after the measurement beam completes the at least two passes; and
overlapping the measurement beam with the other beam after redirecting the measurement beam the second time.
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109. A method comprising:
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directing a first beam along a first path through an interferometer, the first path contacting a first object;
directing a second beam along a second path through the interferometer, the second path contacting a second object, portions of the second path traveling through a region in a direction non-parallel to the direction of the portion of the first beam contacting the first object;
directing portions of the first beam through the region such that a change in the environmental conditions of the region causes equal amounts of change in the optical path lengths of the first and second beams; and
overlapping the first and second beams after being reflected by the first and second objects, respectively. - View Dependent Claims (110, 111, 112, 113, 114, 115, 116)
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Specification