On-site analysis system with central processor and method of analyzing
First Claim
1. A method for predicting a value of a property of interest of a material comprising:
- (1) transmitting data to a processor from at least one data acquisition device, which data is obtained from samples of the material;
(2) processing the data using a calibration model configured to compensate for data acquisition device variance in predicting the value of the property of interest, without depending on knowledge of a particular data acquisition device, and providing an output including a predicted value of the property of interest of the material based on said processing step.
3 Assignments
0 Petitions
Accused Products
Abstract
A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device, a central processor, and a communication link that is connectable between the data acquisition device and the central processor. The central processor is loaded with multivariate calibration models developed for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument variance without instrument-specific calibration transfer. Measurement results generated by the central processor can be transmitted to an output device of a user interface.
-
Citations
176 Claims
-
1. A method for predicting a value of a property of interest of a material comprising:
-
(1) transmitting data to a processor from at least one data acquisition device, which data is obtained from samples of the material; (2) processing the data using a calibration model configured to compensate for data acquisition device variance in predicting the value of the property of interest, without depending on knowledge of a particular data acquisition device, and providing an output including a predicted value of the property of interest of the material based on said processing step. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76)
-
-
77. A system for analyzing a material by predicting a value of a property of interest of the material comprising:
-
(1) at least one data acquisition device for obtaining data on a sample of the material; and (2) a central processor, connectable to the data acquisition device over a communication link, the central processor adapted to provide an output including a predicted value of the property of interest of the material, and loaded with a calibration model configured to compensate for data acquisition device variance in predicting the value of the property of interest without knowledge of a particular data acquisition device. - View Dependent Claims (78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88, 89, 90, 91, 92, 93, 94, 95, 96, 97)
-
-
98. A method for predicting a value of a property of interest of a material comprising:
-
(1) transmitting data to a processor from at least one data acquisition device, which data is obtained from samples of the material; and (2) processing the data using a calibration model configured to compensate for data acquisition device variance in predicting the value of the property of interest without having to develop individual calibrations for each data acquisition device, use data acquisition device corrections or calibration transfer methods to provide predicted values, and providing an output including one or more predicted values of the property of interest of the material based on said processing step. - View Dependent Claims (99, 100, 101, 102, 103, 104, 105, 106, 107, 108, 109, 110, 111, 112, 113, 114, 115, 116, 117, 118, 119, 120, 121, 122, 123, 124, 125, 126, 127, 128, 129, 130, 131, 132, 133, 134, 135, 136, 137, 138, 139, 140, 141, 142, 143, 144, 145, 146, 147, 148, 149, 150, 151, 152, 153, 154, 155, 156, 157, 158, 159, 160, 161, 162, 163, 164, 165, 166, 167, 168, 169, 170, 171, 172, 173)
-
-
174. A system for analyzing a material by predicting a value of a property of interest of the material comprising:
-
(1) at least one data acquisition device for obtaining data an a sample of the material; and (2) a central processor connectable to the data acquisition device over a communication link, the central processor adapted to provide an output including one or more predicted values of the property of interest of the material, and loaded with a calibration model configured to compensate for data acquisition device variance in predicting the value of the property of interest without having to develop individual calibration for each data acquisition device, use data acquisition device corrections or calibration transfer methods to provide the predicted values. - View Dependent Claims (175, 176)
-
Specification