Measuring temperature change in an electronic biomedical implant
First Claim
1. A system for determining a change in temperature of an implanted electronic device, the system comprising:
- circuitry configured to provide power to one or more circuit elements associated with the implanted electronic device, wherein the one or more circuit elements comprise a non-crystal oscillator; and
processor electronics configured to detect a shift in an output frequency associated with the non-crystal oscillator and determine the change in temperature of the implanted electronic device based on the detected output frequency shift.
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Accused Products
Abstract
The change in temperature of an implanted electronic device can be determined by providing power to one or more circuit elements included in the implanted electronic device, wherein the circuit elements comprise a non-crystal oscillator. A shift in the output frequency associated with the non-crystal oscillator can be detected, and the temperature change of the implanted electronic device can be determined based on the detected output frequency shift. One or more signals based on the output frequency associated with the non-crystal oscillator can be transmitted by the implanted electronic device. The transmitted signals can be received by an external device, which can detect the current output frequency associated with the non-crystal oscillator from the transmitted signals and compare the current output frequency with a previous output frequency to determine the output frequency shift associated with the non-crystal oscillator. The output frequency can, for example, be converted to a voltage measure.
149 Citations
11 Claims
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1. A system for determining a change in temperature of an implanted electronic device, the system comprising:
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circuitry configured to provide power to one or more circuit elements associated with the implanted electronic device, wherein the one or more circuit elements comprise a non-crystal oscillator; and processor electronics configured to detect a shift in an output frequency associated with the non-crystal oscillator and determine the change in temperature of the implanted electronic device based on the detected output frequency shift. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification