Automatic optical inspection system and method
First Claim
Patent Images
1. A system comprising:
- a chassis defining locations for performing thereon automatic optical inspection (AOI) to identify possible defects on a printed circuit board being processed, verification of said possible defects and correction of defects on said printed circuit board without removing said printed circuit board from said chassis; and
a controller operative to select between AOI, verification and correction for performing on said printed circuit board.
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Abstract
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
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Citations
21 Claims
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1. A system comprising:
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a chassis defining locations for performing thereon automatic optical inspection (AOI) to identify possible defects on a printed circuit board being processed, verification of said possible defects and correction of defects on said printed circuit board without removing said printed circuit board from said chassis; and a controller operative to select between AOI, verification and correction for performing on said printed circuit board. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for manufacture of printed circuit boards comprising:
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forming a portion of an electrical circuit on a substrate; providing a processing apparatus chassis for processing said substrate, said chassis defining locations for performing thereon functionalities of automatic optical inspection (AOI) to identify possible defects in said portion of an electrical circuit formed on said substrate, verification of said possible defects and correction of defects in said portion of an electrical circuit formed on said substrate without removing said substrate from said chassis; and selecting between AOI, verification and correction functionalities for performing on the substrate. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. An integrated inspection, defect verification and correction system for electrical circuits comprising:
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an electrical circuit processing apparatus chassis defining thereon an inspection location and a defect verification and correction location separated from said inspection location; and an electrical circuit positioner operative to automatically position an electrical circuit to be processed initially at said inspection location on said chassis and thereafter to automatically position said electrical circuit at said defect verification and correction location on said chassis. - View Dependent Claims (16, 17, 18, 19, 20)
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21. An integrated inspection and defect verification system for electrical circuits comprising:
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a chassis defining an inspection location and a defect verification location; an electrical circuit positioner operative automatically to position an electrical circuit initially at said inspection location and thereafter at said defect verification location; and an optical inspection assembly located at said inspection location and a defect verification assembly located at said defect verification location; and an operational mode selector operative to enable operation of said optical inspection assembly and said defect verification assembly to be selectably coordinated in time in at least two different modes of operation including; a first mode wherein the required time of operation of the optical inspection assembly governs the maximum duration of operation of the defect verification assembly; and a second mode wherein the required time of operation of the defect verification assembly governs the maximum duration of operation of the defect verification assembly.
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Specification