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Probe for combined signals

  • US 7,205,784 B2
  • Filed: 05/25/2006
  • Issued: 04/17/2007
  • Est. Priority Date: 11/13/2002
  • Status: Expired due to Fees
First Claim
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1. A probing system for interconnecting a source of a modulated signal and a source of a direct current to a terminal of a device under test having a device impedance, said probing system comprising:

  • (a) a capacitor;

    (b) a resistor connected in series with said capacitor, said resistor and said capacitor interconnecting said source of said modulated signal and said terminal of said device under test; and

    (c) an inductor interconnecting said source of direct current and said terminal of said device under test.

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