Probe for combined signals
First Claim
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1. A probing system for interconnecting a source of a modulated signal and a source of a direct current to a terminal of a device under test having a device impedance, said probing system comprising:
- (a) a capacitor;
(b) a resistor connected in series with said capacitor, said resistor and said capacitor interconnecting said source of said modulated signal and said terminal of said device under test; and
(c) an inductor interconnecting said source of direct current and said terminal of said device under test.
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Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
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Citations
3 Claims
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1. A probing system for interconnecting a source of a modulated signal and a source of a direct current to a terminal of a device under test having a device impedance, said probing system comprising:
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(a) a capacitor; (b) a resistor connected in series with said capacitor, said resistor and said capacitor interconnecting said source of said modulated signal and said terminal of said device under test; and (c) an inductor interconnecting said source of direct current and said terminal of said device under test. - View Dependent Claims (2, 3)
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Specification