Inspection method and system using multifrequency phase analysis
First Claim
1. A method for inspecting a part, the method comprising:
- applying a plurality of multifrequency excitation signals to a probe to generate a plurality of multifrequency response signals for the part being inspected;
and performing a multifrequency phase analysis on the multifrequency response signals,wherein the probe is an eddy current probe, wherein the applying step induces a plurality of eddy currents in the part, wherein the multifrequency response signals are generated by the eddy currents induced in the part with the eddy current probe, and wherein performing the multifrequency phase analysis comprises;
identifying a reference dataset, wherein the reference dataset comprises at least two frequency response signals, and wherein the at least two frequency response signals comprise distinct frequency ranges;
mixing the at least two frequency response signals to determine a plurality of processing parameters;
and applying the processing parameters to a multifrequency response signal dataset to generate a noise-filtered dataset, the method further comprising;
using the multifrequency phase analysis to inspect a subsurface of the part.
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Abstract
A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.
16 Citations
21 Claims
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1. A method for inspecting a part, the method comprising:
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applying a plurality of multifrequency excitation signals to a probe to generate a plurality of multifrequency response signals for the part being inspected; and performing a multifrequency phase analysis on the multifrequency response signals, wherein the probe is an eddy current probe, wherein the applying step induces a plurality of eddy currents in the part, wherein the multifrequency response signals are generated by the eddy currents induced in the part with the eddy current probe, and wherein performing the multifrequency phase analysis comprises; identifying a reference dataset, wherein the reference dataset comprises at least two frequency response signals, and wherein the at least two frequency response signals comprise distinct frequency ranges; mixing the at least two frequency response signals to determine a plurality of processing parameters; and applying the processing parameters to a multifrequency response signal dataset to generate a noise-filtered dataset, the method further comprising; using the multifrequency phase analysis to inspect a subsurface of the part. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method for performing subsurface defect inspections using eddy currents, the method comprising:
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applying a plurality of multifrequency signals to an eddy current probe; generating a plurality of multifrequency response signals from the plurality of multifrequency signals, wherein the plurality of multifrequency response signals are included in a multifrequency response dataset; identifying a reference free dataset comprising at least two frequency response signals, wherein the reference free dataset is a subset of the multifrequency response dataset, and wherein the at least two frequency signals comprise distinct frequency ranges; mixing the at least two frequency response signals to determine a plurality of processing parameters; applying the plurality of processing parameters to the multifrequency response signal dataset to generate a noise-filtered image dataset; performing a phase analysis on the noise-filtered dataset, and using the noise filtered dataset to inspect a subsurface of a part. - View Dependent Claims (10, 11, 12, 13, 14)
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15. An inspection system comprising:
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an eddy current probe configured to induce eddy currents in a part, for performing an inspection of the part; an eddy current instrument coupled to the eddy current probe, wherein the eddy current instrument is configured to apply a plurality of multifrequency excitation signals to the eddy current probe to generate a plurality of multifrequency response signals; and a processor configured to analyze the multifrequency response signals from the eddy current instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part, wherein the processor is further configured to; identify a reference dataset, wherein the reference dataset comprises at least two frequency response signals, and wherein the at least two frequency response signals comprise distinct frequency ranges; mix the at least two frequency response signals to determine a plurality of processing parameters; and apply the processing parameters to a multifrequency response signal dataset to generate a noise-filtered dataset. - View Dependent Claims (16, 17, 18, 19, 20)
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21. A computer-readable medium storing computer instructions for instructing a computer system for performing subsurface defect inspections, the computer instructions comprising:
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applying a plurality of multifrequency signals to an eddy current probe to generate a plurality of multifrequency response signals, wherein the plurality of multifrequency response signals are included in a multifrequency response dataset; identifying a reference dataset comprising at least two frequency response signals, wherein the reference dataset is a subset of the multifrequency response dataset, and wherein the at least two frequency signals comprise distinct frequency ranges; mixing the at least two frequency response signals to determine a plurality of processing parameters; applying the plurality of processing parameters to the multifrequency response signal dataset to generate a noise-filtered dataset; performing a phase analysis on the noise-filtered image dataset; and using the noise-filtered dataset to inspect a subsurface of a part.
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Specification