Methods and apparatus for data analysis
First Claim
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1. A test system, comprising:
- a tester configured to test a set of components and generate test data for the set of components, wherein the components are fabricated in accordance with a fabrication process; and
a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a characteristic of the fabrication process for the components, wherein the diagnostic system comprises a pattern recognition system configured to recognize a pattern in the test data, wherein the pattern recognition system includes a feature extractor configured to extract a feature from the test data associated with the pattern, wherein the feature extractor calculates at least one of a mass, a centroid, a geometric moment, and a moment of Hu based on the test data.
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
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Citations
38 Claims
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1. A test system, comprising:
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a tester configured to test a set of components and generate test data for the set of components, wherein the components are fabricated in accordance with a fabrication process; and a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a characteristic of the fabrication process for the components, wherein the diagnostic system comprises a pattern recognition system configured to recognize a pattern in the test data, wherein the pattern recognition system includes a feature extractor configured to extract a feature from the test data associated with the pattern, wherein the feature extractor calculates at least one of a mass, a centroid, a geometric moment, and a moment of Hu based on the test data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A test data analysis system for analyzing test data for a set of components fabricated and tested using a fabrication process, comprising:
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a memory for storing the test data; and a diagnostic system having access to the memory and configured to identify a characteristic of the fabrication process based on the test data, wherein the diagnostic system comprises a pattern recognition system configured to recognize a pattern in the test data, wherein the pattern recognition system includes a feature extractor configured to extract a feature from the test data associated with the pattern, wherein the feature extractor calculates at least one of a mass, a centroid, a geometric moment, and a moment of Hu based on the test data. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A computer-implemented method for testing components fabricated and tested according to a fabrication process, comprising:
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obtaining test data for the components; automatically identifying a characteristic of the fabrication process based on the test data, wherein automatically identifying the characteristic comprises recognizing a pattern in the test data, wherein antomaticatly identifying the characteristic comprises extracting a feature from the test data associated with the recognized pattern, wherein the feature comprises at least one of a mass, a centroid, a geometric moment, and a moment of Hu based on the test data; and storing information relating to the identified characteristic in a memory. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29)
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30. A medium storing instructions executable by a machine, wherein the instructions cause the machine to execute a method for analyzing test data comprising:
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obtaining test data for the components; automatically identifying a characteristic of the fabrication process based on the test data, wherein automatically identifying the characteristic comprises recognizing a pattern in the test data, wherein automatically identifying the characteristic comprises extracting a feature from the test data associated with the recognized pattern, wherein the feature comprises at least one of a mass, a centroid, a geometric moment, and a moment of Hu based on the test data; and storing information relating to the identified characteristic in a memory. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38)
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Specification