ABIST-assisted detection of scan chain defects
First Claim
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1. A method of detecting a defect in a scan chain, the method comprising:
- applying a plurality of pattern sets to a scan chain using an array built-in self-test (ABIST) circuit coupled to the scan chain;
collecting, from the scan chain, scan out data generated as a result of the application of the plurality of pattern sets to the scan chain; and
using the collected scan out data to identify a defective latch in the scan chain.
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Abstract
An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.
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Citations
20 Claims
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1. A method of detecting a defect in a scan chain, the method comprising:
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applying a plurality of pattern sets to a scan chain using an array built-in self-test (ABIST) circuit coupled to the scan chain; collecting, from the scan chain, scan out data generated as a result of the application of the plurality of pattern sets to the scan chain; and using the collected scan out data to identify a defective latch in the scan chain. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An apparatus, comprising:
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a memory; and program code resident in the memory and configured to detect a defect in a scan chain disposed in an integrated circuit device by collecting, from the scan chain, scan out data generated as a result of an application of a plurality of pattern sets to the scan chain by an array built-in self-test (ABIST) circuit disposed in the integrated circuit device, and using the collected scan out data to identify a defective latch in the scan chain. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16)
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17. A program product, comprising:
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program code configured to detect a defect in a scan chain disposed in an integrated circuit device by collecting, from the scan chain, scan out data generated as a result of an application of a plurality of pattern sets to the scan chain by an array built-in self-test (ABIST) circuit disposed in the integrated circuit device, and using the collected scan out data to identify a defective latch in the scan chain; and a computer readable signal bearing medium bearing the program code. - View Dependent Claims (18)
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19. A method of detecting a defect in a scan chain, the method comprising:
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applying a first plurality of pattern sets to a scan chain coupled to an array built-in self-test (ABIST) circuit; collecting, from the scan chain, scan out data generated as a result of the application of the first plurality of pattern sets to the scan chain; using the collected scan out data to identify a defective latch in the scan chain; sensitizing at least one alternate path within which the scan chain is disposed; and applying a second plurality of pattern sets to the scan chain while the alternate path is sensitized.
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20. An apparatus, comprising:
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a memory; and program code resident in the memory and configured to detect a defect in a scan chain disposed in an integrated circuit device by collecting, from the scan chain, scan out data generated as a result of an application of a first plurality of pattern sets to the scan chain by an array built-in self-test (ABIST) circuit disposed in the integrated circuit device, and using the collected scan out data to identify a defective latch in the scan chain, wherein the program code is further configured to sensitize at least one alternate path within which the scan chain is disposed, and apply a second plurality of pattern sets to the scan chain while the alternate path is sensitized.
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Specification