Method for setting the system parameters of a scanning microscope

• US 7,227,112 B2
• Filed: 06/25/2003
• Issued: 06/05/2007
• Est. Priority Date: 06/29/2002
• Status: Active Grant

• Current Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Original Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Inventors: Storz, Rafael
• Primary Examiner(s): Epps; Georgia
• Assistant Examiner(s): BUI PHO, PASCAL M
• Application Number:
  US10/603,310
• Publication Number:
  US 20040000639A1
• Time in Patent Office: 1,441 Days
• Field of Search: 250/201.3, 250/234, 250/235, 250/208.1, 250/306, 250/307, 250/458.1, 250/459.1, 250/311, 359/368, 359/379, 359/380, 359/383, 359/384, 348/79, 348/80, 348/61
• US Class Current: 250/201.3
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM]
• CPC Class Codes: G02B 21/0048 scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 21/0076 arrangements using fluorescence or luminescence
• CPC Class Codes: G02B 21/008 Details of detection or image processing, including general computer control

Abstract

The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. After an image of the specimen is acquired at least one image quality feature is inputted by a user and is converted by the control computer into at least one system parameter of the scanning microscope.

Claims

1. A method for setting the system parameters of a scanning microscope comprising the steps of:

Controlling an acquisition of an image of a specimen with a control computer;

Inputting at least one image quality feature after an image of the specimen is acquired, the at least one image quality feature including at least one of a noise of detected image data, a signal-to-noise ratio of the detected image data, a bleaching behavior of a flourescent marking of a specimen, a detection speed of an image data set to be detected, a contrast, and a resolution;

Converting the at least one image quality feature into at least one system parameter of the scanning microscope by the control computer, the at least one system parameter including at least one of a power level of a light source, a wavelength of the light source, a scanning speed of a scanning unit, a diameter of a confocal detection pinhole, an amplifier characteristic of a confocal detector, and a number of individual images to be detected for averaging of an image; and

Setting the at least one system parameter;

wherein an image quality expected to be achievable, for the at least one inputted image quality feature, is calculated in the next acquired image and outputted to the user; and

wherein an inputted image quality feature, upon conversion into system parameters of the scanning microscope, influences or modifies several system parameters of the scanning microscope.