Slotted electrostatic shield modification for improved etch and CVD process uniformity
First Claim
1. In a processing chamber that uses an inductively coupled plasma source defining an axis of symmetry which produces a plasma density having a given radial variation characteristic across a treatment surface of a treatment object therein using a given electrostatic shield, a method comprising:
- configuring an electrostatic shield arrangement to replace said given electrostatic shield in a way which provides for producing a modified radial variation characteristic across said treatment surface which is different than said given radial variation characteristic and said electrostatic shield arrangement is further configured to include at least a sidewall arrangement having a shape that extends through a range of radii relative to said axis of symmetry having a modified slot arrangement that is made up of a plurality of elongated modified slots, each of which includes a length in said sidewall that extends through at least a portion of said range of radii and each of which includes a width that varies at least partially along said length for producing said modified radial variation characteristic.
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Accused Products
Abstract
A more uniform plasma process is implemented for treating a treatment object using an inductively coupled plasma source which produces an asymmetric plasma density pattern at the treatment surface using a slotted electrostatic shield having uniformly spaced-apart slots. The slotted electrostatic shield is modified in a way which compensates for the asymmetric plasma density pattern to provide a modified plasma density pattern at the treatment surface. A more uniform radial plasma process is described in which an electrostatic shield arrangement is configured to replace a given electrostatic shield in a way which provides for producing a modified radial variation characteristic across the treatment surface. The inductively coupled plasma source defines an axis of symmetry and the electrostatic shield arrangement is configured to include a shape that extends through a range of radii relative to the axis of symmetry.
84 Citations
20 Claims
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1. In a processing chamber that uses an inductively coupled plasma source defining an axis of symmetry which produces a plasma density having a given radial variation characteristic across a treatment surface of a treatment object therein using a given electrostatic shield, a method comprising:
configuring an electrostatic shield arrangement to replace said given electrostatic shield in a way which provides for producing a modified radial variation characteristic across said treatment surface which is different than said given radial variation characteristic and said electrostatic shield arrangement is further configured to include at least a sidewall arrangement having a shape that extends through a range of radii relative to said axis of symmetry having a modified slot arrangement that is made up of a plurality of elongated modified slots, each of which includes a length in said sidewall that extends through at least a portion of said range of radii and each of which includes a width that varies at least partially along said length for producing said modified radial variation characteristic. - View Dependent Claims (2, 3, 4, 5, 6, 20)
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7. In a processing chamber that uses an inductively coupled plasma source that defines an axis of symmetry and which produces a plasma density having a given radial variation characteristic across a treatment surface of a treatment object therein using a given electrostatic shield, a method comprising:
configuring an electrostatic shield arrangement to include at least a sidewall arrangement having a shape that extends through a range of radii relative to said axis of symmetry to replace said given electrostatic shield to provide for producing a modified radial variation characteristic across said treatment surface which is different than said given radial variation characteristic by arranging said electrostatic shield arrangement to include at least a first, inner shield member and a second, outer shield member, said inner shield member defining a first aperture pattern and said outer shield member defining a second aperture pattern, and supporting the outer shield member outside of and adjacent to the inner shield member and rotating the outer shield member relative to the inner shield member to cause the first aperture pattern to cooperate with the second aperture pattern in a way which provides a range in said modified radial variation characteristic across said treatment surface. - View Dependent Claims (8, 9)
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10. In a processing chamber that uses an inductively coupled plasma source that defines an axis of symmetry and which produces a plasma density having a given radial variation characteristic across a treatment surface of a treatment object therein using a given electrostatic shield, a method comprising:
configuring an electrostatic shield arrangement to include at least a sidewall arrangement having a shape that extends through a range of radii relative to said axis of symmetry to replace said given electrostatic shield to provide for producing a modified radial variation characteristic across said treatment surface which is different than said given radial variation characteristic by arranging said electrostatic shield arrangement to include at least a first shield member and a second shield member, said first shield member defining a first aperture pattern, and supporting said second shield member outside the first shield member for linear movement in relation to the first shield member in a way which produces a range in said modified radial variation characteristic across said treatment surface. - View Dependent Claims (11, 12, 13, 14, 15)
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16. In a processing chamber that uses an inductively coupled plasma source that defines an axis of symmetry and which produces a plasma density having a given radial variation characteristic across a treatment surface of a treatment object therein using a given electrostatic shield, a method comprising:
configuring an electrostatic shield arrangement to include at least a sidewall arrangement having a shape that extends through a range of radii relative to said axis of symmetry to replace said given electrostatic shield in a way which provides for producing a modified radial variation characteristic across said treatment surface which is different than said given radial variation characteristic by arranging said electrostatic shield arrangement to include at least a first shield member and a second shield member, said first shield member defining a first aperture pattern and said second shield member defining a second aperture pattern, and supporting said second shield member outside the first shield member for rotational movement about said axis of symmetry and in relation to the first shield member in a way which produces a range in said modified radial variation characteristic across said treatment surface by rotating the second shield member relative to the first shield member. - View Dependent Claims (17, 18, 19)
Specification