Ergonomic, rotatable electronic component testing apparatus

• US 7,233,159 B2
• Filed: 06/02/2004
• Issued: 06/19/2007
• Est. Priority Date: 06/02/2004
• Status: Expired due to Fees

• Current Assignee: EMC Corporation (Dell Technologies Inc.)
• Original Assignee: EMC Corporation (Dell Technologies Inc.)
• Inventors: Allgeyer, Joseph Peter
• Primary Examiner(s): Nguyen; Ha Tran
• Assistant Examiner(s): ISLA RODAS, RICHARD
• Application Number:
  US10/858,991
• Publication Number:
  US 20050269308A1
• Time in Patent Office: 1,112 Days
• Field of Search: None
• US Class Current: 324/750.08
• CPC Class Codes: F27B 17/0016 Chamber type furnaces
• CPC Class Codes: F27B 17/02 specially designed for laboratory use
• CPC Class Codes: F27B 5/00 Muffle furnaces; Retort furnaces; Other furnaces in which the charge is held completely isolated F27B9/00 takes precedence

Abstract

Apparatuses and methods for testing electronic components, such as printed circuit boards, in an ergonomic manner are disclosed. An electronic component testing apparatus comprises a base, a test chamber rotatably mounted to the base, and a heating and cooling unit coupled to the test chamber. The test chamber further includes a chassis defining an enclosure having an opening and at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component.

Claims

1. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having pairs of opposing sidewalls, wherein each of the opposing sidewalls includes an opening; and

(ii) at least one test slot accessible through the openings for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base and so that interior of the test chamber can be accessed from different sides through the openings; and

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure.

2. The electronic component testing apparatus of claim 1 wherein the base includes an upper horizontal frame and a lower horizontal frame, the upper and lower horizontal frames being connected by at least one vertical strut.

3. The electronic component testing apparatus of claim 2 wherein the base includes wheels attached to the lower horizontal frame so that the base is mobile over a surface.

4. The electronic component testing apparatus of claim 1 wherein the test chamber includes a door that covers the opening of the enclosure.

5. The electronic component testing apparatus of claim 4 wherein the door comprises at least one pane of glass.

6. The electronic component testing apparatus of claim 4 wherein the door is removably connected to the test chamber.

7. The electronic component testing apparatus of claim 1 wherein the test chamber further includes a light source located in the enclosure.

8. The electronic component testing apparatus of claim 1 wherein the test chamber further includes a power strip for providing a plurality of power connections to the chamber via a single power cable.

9. The electronic component testing apparatus of claim 1 wherein the chassis of the test chamber further includes a chassis heater.

10. The electronic component testing apparatus of claim 9 wherein at least a portion of the chassis heater is imbedded in the chassis.

11. The electronic component testing apparatus of claim 9 wherein at least a portion of the chassis heater is mounted on a surface of the chassis.

12. The electronic component testing apparatus of claim 1 wherein the chassis of the test chamber comprises a metal material.

13. The electronic component testing apparatus of claim 12 wherein the metal comprises extruded aluminum.

14. The electronic component testing apparatus of claim 1 wherein the heating and cooling unit is coupled to the test chamber without the use of intermediate ductwork.

15. The electronic component testing apparatus of claim 1 comprising a thermostat coupled to the heating and cooling unit for controlling output of the heating and cooling unit.

16. The electronic component testing apparatus of claim 1 wherein the electronic component comprises a printed circuit board.

17. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having at least one opening;

(ii) at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component; and

(iii) a door that covers the opening of the enclosure with the door being removably connected to the test chamber;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base;

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure; and

(e) at least one door retainer attached to the base and adapted to receive the door when the door is removed from the test chamber.

18. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having at least one opening; and

(ii) at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base;

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure; and

wherein the test chamber further includes a directable dry air purge apparatus.

19. The electronic component testing apparatus of claim 18 wherein the directable dry air purge apparatus is rotatable about a first axis and pivotable about a second axis transverse to the first axis.

20. The electronic component testing apparatus of claim 18 wherein the directable dry air purge apparatus includes a regulator for regulating airflow through the dry air purge apparatus.

21. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having at least one opening; and

(ii) at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base;

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure; and

a chassis heater, wherein the chassis heater comprises self-regulating heat tape.

22. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having at least one opening; and

(ii) at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base;

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure; and

wherein the rotational coupling includes a hub and an axle, wherein the test chamber is fixedly attached to the hub, the base is fixedly attached to the axle, and the axle is rotationally coupled to the hub.

23. The electronic component testing apparatus of claim 22 wherein the hub includes roller bearings for facilitating rotational movement of the hub and attached test chamber around the axle and attached base.

24. An electronic component testing apparatus comprising:

(a) a base;

(b) a test chamber including;

(i) a chassis defining an enclosure having at least one opening; and

(ii) at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component;

(c) a rotational coupling for coupling the base to the test chamber so that the test chamber is rotatable with respect to the base;

(d) a heating and cooling unit coupled to the test chamber for controlling temperature within the enclosure; and

wherein the rotational coupling includes a hub and an axle, wherein the test chamber is fixedly attached to the axle, the base is fixedly attached to the hub, and the axle is rotationally coupled to the hub.

25. The electronic component testing apparatus of claim 24 wherein the hub includes roller bearings for facilitating rotational movement of the hub and attached base around the axle and attached test chamber.