Method and device for detecting patterns on a substrate

• US 7,242,463 B2
• Filed: 04/28/2005
• Issued: 07/10/2007
• Est. Priority Date: 05/05/2004
• Status: Expired due to Fees

• Current Assignee: Bobst SA (JBF Finance SA)
• Original Assignee: Bobst SA (JBF Finance SA)
• Inventors: Pilloud, Francis, Servet, Patrick
• Primary Examiner(s): Richards; N. Drew
• Assistant Examiner(s): PAJOOHI GOMEZ, TARA S
• Application Number:
  US11/116,526
• Publication Number:
  US 20050248767A1
• Time in Patent Office: 803 Days
• Field of Search: 2505591-55946, 356426-431, 356/71, 356603-604, 356458-459, 235/375, 235/435, 235/380, 235/454
• US Class Current: 356/71
• CPC Class Codes: G01N 21/8901 Optical details; Scanning details per se G02B

Abstract

Device for detecting patterns on a travelling substrate, namely on a substrate being deposited on a sheet or on web matter, wherein the substrate is a metallized foil travelling in a travelling direction. The device comprises a housing for a first incidental beam issued from a first source of light, a second incidental beam issued from a second source of light, an optical measuring system, a photosensitive sensor respectively delivering beams reflected from the substrate and an electronic unit connected to a communication port. The optical measuring system is telecentric, the first incidental beam crosses a telecentric lighting system and the second incidental beam crosses an oblique lighting system.

Claims

1. A device for detecting patterns on a travelling substrate travelling in a travel direction, comprising:

a housing;

a first source of light issuing a first incidental beam toward the substrate;

a second source of light issuing a second incidental beam toward the substrate;

an optical measuring system, a photosensitive sensor respectively collecting reflected beams from the substrate wherein the optical measuring system is telecentric, the first incidental beam crosses a telecentric lighting system and the second incidental beam crosses an oblique lighting system; and

an electronic unit connected to the sensor and connected to a communication port.

2. The detection device according to claim 1, wherein the optical measuring system comprises a semi transparent deviation blade;

a first optical system crossed by the first and the second incidental beams and the respective first and second reflected beams generated by the first and second incidental beams;

a semi-transparent deviation blade; and

a second optical system positioned to be crossed only by the first and second reflected beams after they have been reflected on the semi-transparent deviation blade.

3. The detection device according to claim 2, wherein the telecentric lighting system comprises the semi-transparent deviation blade and the first optical system, and the first optical system comprises the oblique lighting system.

4. The detection device according to claim 1, wherein the photosensitive sensor is a linear photosensitive sensor operable to produce an image of a transverse portion of the substrate with respect to the travel direction.

5. The detection device according to claim 1, wherein the first source of light and the second source of light each produce a light of at least one first color and one second color.

6. The detection device according to claim 1, wherein the first color is blue and the second color is red.

7. The detection device according to claim 3, wherein the oblique light system comprises a second deviation unit from the second incidental beam and the second deviation unit is swivellingly adjustable with respect to the second incidental beam.

8. A device for detecting patterns on a travelling substrate travelling in a travel direction, comprising:

a housing;

a first source of light issuing a first incidental beam toward the substrate;

a second source of light issuing a second incidental beam toward the substrate;

a first beam deflector shaped and positioned for deflecting the beam from the first source of light telecentrically on an axis toward the substrate;

a second beam deflector shaped and positioned to deflect the beam from the second source of light obliquely of the axis and toward the substrate;

a deflection blade positioned for deflecting the reflected light from the substrate, supplied by the first and the second light sources, toward an optical system;

an optical measuring system, a photosensitive sensor respectively collecting reflected beams from the substrate wherein the optical measuring system is telecentric, the first incidental beam crosses a telecentric lighting system and the second incidental beam crosses an oblique lighting system; and

an electronic unit connected to the sensor and connected to a communication port.