Memory testing device and method
First Claim
Patent Images
1. A memory testing apparatus for testing a plurality of areas of memory cells of a first memory device and a second memory device, comprising:
- a waveform-shaping module configured to generate a plurality of test signals according to a plurality of address signals and to output each of the plurality of test signals to one of the memory devices;
a comparing module configured to compare expected values corresponding to the test signals with output signals from corresponding memory devices of the first memory device and the second memory device in response to the plurality often signals, and to output a plurality of comparison results;
an address-compressing module configured to generate compressed addresses for the plurality of comparison results; and
an error catch memory configured to record outputted comparison results for both the first memory device and the second memory device in a corresponding plurality of consecutive divisions of the error catch memory according to a corresponding plurality of the compressed addresses for the first memory device and the second memory device, each of the outputted comparison results being stored as a single bit;
wherein the memory testing apparatus is configured to test all areas of the plurality of areas and not to test all memory cells in a given area when any comparison result is indicative of a failed memory cell in that area.
1 Assignment
0 Petitions
Accused Products
Abstract
A memory testing apparatus rapidly tests memory devices with a relatively small error catch memory. The memory testing apparatus provides an address compressing module that minimizes an amount of error catch memory necessary to test one or more memory devices. The memory testing apparatus further divides each of the memory devices into a plurality of areas, and tests each area sequentially until a bit failure is detected in the area thereby attenuating testing time.
11 Citations
30 Claims
-
1. A memory testing apparatus for testing a plurality of areas of memory cells of a first memory device and a second memory device, comprising:
-
a waveform-shaping module configured to generate a plurality of test signals according to a plurality of address signals and to output each of the plurality of test signals to one of the memory devices; a comparing module configured to compare expected values corresponding to the test signals with output signals from corresponding memory devices of the first memory device and the second memory device in response to the plurality often signals, and to output a plurality of comparison results; an address-compressing module configured to generate compressed addresses for the plurality of comparison results; and an error catch memory configured to record outputted comparison results for both the first memory device and the second memory device in a corresponding plurality of consecutive divisions of the error catch memory according to a corresponding plurality of the compressed addresses for the first memory device and the second memory device, each of the outputted comparison results being stored as a single bit; wherein the memory testing apparatus is configured to test all areas of the plurality of areas and not to test all memory cells in a given area when any comparison result is indicative of a failed memory cell in that area. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. A memory testing apparatus for testing a plurality of areas of memory cells of at least one memory device, comprising:
-
a waveform-shaping module configured to generate a test signal according to an address signal and to output the test signal to the memory device; a comparing module configured to compare an expected value with an output signal received from the memory device in response to the test signal, and to output a comparison result; an address-compressing module configured to generate a compressed address for the comparison result; and an error catch memory configured to record the comparison result in a memory location of the error catch memory according to the compressed address; wherein the memory testing apparatus is configured to test all areas of the plurality of areas and not to rest all memory cells in a given area upon a comparison result is indicative of a failed memory cell in that area; wherein the at least one memory device includes a first memory device and a second memory device; and wherein the error catch memory comprises a plurality of consecutive divisions, each division storing comparison results indicative of failed areas of a given one of the memory devices and each comparison result being stored as a single bit.
-
-
12. A memory testing apparatus for testing a plurality of areas of memory locations of a first memory device and a second memory device, the memory testing apparatus testing the first and second memory devices in parallel and comprising:
-
a waveform-shaping module configured to generate a plurality of test signals, the test signals comprising a plurality of address signals and a plurality of expected values, each of the plurality of address signals pointing to an area of a corresponding one of the memory devices, the waveform-shaping module further being configured to output a the test signals to the memory devices in parallel so that the memory devices are tested in parallel; and a comparing module configured to sequentially compare bits of output signals, received from the memory devices in response to the test signals, with corresponding bits of expected values, the comparing module being configured to output comparison results and further being configured to stop comparing the bits of the output signals and the expected values when a any mismatch is detected between a bit of an output signal and a corresponding bit of an expected value, the mismatch indicating a failed memory location of a memory device; wherein the comparing module is configured to compare the expected values with output signals from the memory devices, which are received from the memory devices in response to the test signals, and the comparing module being configured to output comparison results; wherein the memory testing apparatus further comprises an address-compressing module that is configured to generate compressed addresses for the comparison results, using corresponding address signals; and wherein the memory testing apparatus further comprises an error catch memory that is configured to receive comparison results for the memory devices and record tern in a plurality of consecutive divisions of the error catch memory according to a corresponding plurality of the compressed addresses, each division storing comparison results indicative of failed areas of a given one of the memory devices and each of the comparison results being stored as a single bit. - View Dependent Claims (13, 14, 15, 16, 17, 18)
-
-
19. A memory testing method for testing a plurality of areas of memory cells of a first memory device and a second memory device, comprising:
-
generating a plurality of test signals according to a plurality of address signals; outputting in a parallel fashion each of the plurality of test signals to the memory devices so that the memory devices are tested in parallel; comparing expected values corresponding to the test signals with output signals from corresponding memory devices in response to the test signals; outputting comparison results corresponding to the memory devices; generating compressed addresses for the comparison results; and recording the comparison results for the memory devices in consecutive divisions of an error catch memory according to the compressed addresses, each division storing comparison results indicative of failed areas of a given one of the memory devices and each comparison result being stored as a single bit wherein all areas of the plurality of areas are tested but not all memory cells in a given area are tested upon any occurrence of a comparison result indicative of a failed memory cell in that area. - View Dependent Claims (20, 21, 22, 23, 24)
-
-
25. A memory testing method for testing a plurality of areas of memory locations of a plurality of memory devices, wherein the plurality of memory devices are tested in parallel, the memory testing method comprising:
-
generating a plurality of test signals, the test signals comprising a plurality of address signals and a plurality of expected values, each of the plurality of address signals pointing to an area of a corresponding one of the memory devices; outputting in parallel the test signals to the memory devices; sequentially comparing bits of output signals, received from each of the memory devices in response to the test signals, with corresponding bits of expected values, the comparing of bits of the output signals and the expected values being halted for any one of the memory devices being tested in parallel when any occurrence of a mismatch is detected between a bit of an output signal and a corresponding bit of an expected value, the mismatch indicating a failed memory location of the corresponding memory device; and recording comparison results for the memory devices in a corresponding plurality of memory locations of an error catch memory, wherein the error catch memory comprises a plurality of consecutive divisions, each division storing comparison results indicative of failed areas of a given one of the memory devices and each comparison result being stored as a single bit. - View Dependent Claims (26, 27, 28, 29, 30)
-
Specification