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Predictive, adaptive power supply for an integrated circuit under test

  • US 7,245,120 B2
  • Filed: 09/27/2005
  • Issued: 07/17/2007
  • Est. Priority Date: 01/18/2000
  • Status: Expired due to Fees
First Claim
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1. A method of testing a semiconductor device using a test apparatus, comprising:

  • creating a demand record of expected input demand at a power terminal of the semiconductor device correlated in time with a test sequence for the semiconductor device;

    testing the semiconductor device in accordance with the test sequence; and

    providing during the testing power to the semiconductor device in accordance with the demand record, wherein the providing power comprises;

    generating a first supply of power to the power terminal of the semiconductor device; and

    selectively generating a second supply of power to the power terminal of the semiconductor device in accordance with the demand record such that the second supply of power is provided substantially concurrently with an expected increase in demand for current at the power terminal.

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