Circuits and methods for current measurements referred to a precision impedance
First Claim
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1. A system comprising:
- an integrated circuit;
a first impedance disposed on the integrated circuit;
a second impedance disposed on the integrated circuit;
a first measurement device coupled to the first impedance configured to measure a first voltage drop across the first impedance;
a second measurement device coupled to the second impedance configured to measure a second voltage drop across the second impedance;
a third impedance disposed outside of the integrated circuit;
a third measurement device coupled to the third impedance configured to measure a third voltage drop across the third impedance; and
processing circuitry that utilizes information from the first, second, and third measurement devices to determine a current supplied by the integrated circuit.
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Abstract
Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.
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Citations
34 Claims
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1. A system comprising:
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an integrated circuit; a first impedance disposed on the integrated circuit; a second impedance disposed on the integrated circuit; a first measurement device coupled to the first impedance configured to measure a first voltage drop across the first impedance; a second measurement device coupled to the second impedance configured to measure a second voltage drop across the second impedance; a third impedance disposed outside of the integrated circuit; a third measurement device coupled to the third impedance configured to measure a third voltage drop across the third impedance; and processing circuitry that utilizes information from the first, second, and third measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system comprising:
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an integrated circuit; a first resistive element disposed on the integrated circuit; a second resistive element disposed outside of the integrated circuit; a first measurement device coupled to the first resistive element configured to measure a first voltage drop across the first resistive element; a second measurement device coupled to the second resistive element configured to measure a second voltage drop across the second resistive element; and processing circuitry that utilizes information from the first and second measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. A system comprising:
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an integrated circuit; a reference voltage source; a first measurement device configured to measure voltage levels across two impedance elements located on the integrated circuit relative to the reference voltage source; a second measurement device configured to measure the voltage level across an impedance element external to the integrated circuit relative to the reference voltage source; and processing circuitry that utilizes information from the first and second measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26)
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27. A method comprising:
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providing an integrated circuit; providing a first impedance disposed on the integrated circuit; providing a second impedance disposed on the integrated circuit; measuring a first voltage drop across the first impedance; measuring a second voltage drop across the second impedance; providing a third impedance disposed outside of the integrated circuit; measuring a third voltage drop across the third impedance; and utilizing the first, second, and third measurements to calculate a supplied current from the integrated circuit. - View Dependent Claims (28, 29, 30, 31, 32, 33, 34)
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Specification