Liquid cell and passivated probe for atomic force microscopy and chemical sensing

• US 7,260,980 B2
• Filed: 03/10/2004
• Issued: 08/28/2007
• Est. Priority Date: 03/11/2003
• Status: Active Grant

• Current Assignee: Board of Regents Nevada System of Higher Education (State of Nevada)
• Original Assignee: Benjamin S. Rogers, Jesse D. Adams, Todd A. Sulchek
• Inventors: Adams, Jesse D., Sulchek, Todd A., Rogers, Benjamin S.
• Primary Examiner(s): RAEVIS, ROBERT R
• Application Number:
  US11/089,559
• Publication Number:
  US 20050199047A1
• Time in Patent Office: 1,266 Days
• Field of Search: 731/05, 73/310.5, 73/310.3, 73/310.1, 73/232, 73/530.1, 73/614.1, 73/614.3, 73/614.9, 73/617.9, 73/645.3
• US Class Current: 73/31.05
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 30/14 Liquid environment
• CPC Class Codes: G01Q 60/42 Functionalisation

Abstract

The invention provides a liquid cell for an atomic force microscope. The liquid cell includes a liquid cell housing with an internal cavity to contain a fluid, a plurality of conductive feedthroughs traversing the liquid cell housing between the internal cavity and a dry side of the liquid cell, a cantilevered probe coupled to the liquid cell housing, and a piezoelectric drive element disposed on the cantilevered probe. The cantilevered probe is actuated when a drive voltage is applied to the piezoelectric drive element through at least one of the conductive feedthroughs. A method of imaging an object in a liquid medium and a method of sensing a target species with the liquid cell are also disclosed.

Claims

1. A method of sensing a target species with a cell, comprising:

providing a cell comprising a cantilevered probe coupled to an internal cavity of the cell;

driving the cantilevered probe with an excitation voltage, wherein the excitation voltage is applied to a piezoelectric element on the cantilevered probe through at least one conductive feedthrough connected between the internal cavity and an outer surface of the cell;

measuring a first deflection amplitude of the cantilevered probe with the piezoelectric element;

exposing a treated section of the cantilevered probe to a target species;

measuring a second deflection amplitude of the cantilevered probe; and

determining the target species based on the first deflection amplitude and the second deflection amplitude.

2. The method of claim 1 wherein the piezoelectric element is at least partially made from one or more materials selected from the group consisting of zinc oxide, lead zirconate titanate, polyvinylidene fluoride, and a piezoelectric film.

3. The method of claim 1 wherein the piezoelectric element is passivated to electrically isolate the piezoelectric element when a conductive fluid is placed in the internal cavity of the cell.

4. The method of claim 1 wherein the piezoelectric element is passivated with a material selected from the group consisting of silicon nitride, silicon dioxide, parylene, Teflon, an insulating polymer, and an insulating material.

5. The method of claim 1 wherein the cantilevered probe is driven at a frequency near a resonant frequency of the cantilevered probe.

6. The method of claim 1 further comprising:

measuring a first frequency of the cantilevered probe with the piezoelectric element coupled to the cantilevered probe;

exposing the treated section of the cantilevered probe to the target species;

measuring a second frequency of the cantilevered probe; and

determining the target species based on the first frequency measurement and the second frequency measurement.

7. The method of claim 1 further comprising injecting a fluid into the interior cavity of the cell through an inlet port connected between the internal cavity and an outer surface of the cell, the fluid comprising the target species.

8. The method of claim 1 further comprising tapping an atomic probe tip coupled to a free end of the cantilevered probe against a mechanical stop, the mechanical stop coupled to a base end of the cantilevered probe.

9. The method of claim 1 wherein the cantilevered probe is driven at a higher order resonant mode.

10. The method of claim 1 further comprising sensing cantilever bending based on measuring a second deflection amplitude of the cantilevered probe.

11. The method of claim 1 further comprising compensating for temperature variation induced cantilever deflection.

12. The method of claim 11, wherein the cantilevered probe comprises a resistive heater, further comprising heating the resistive heater to compensate for temperature variation induced cantilever deflection.

13. The method of claim 1, wherein the cantilevered probe comprises a resistive heater, further comprising heating the resistive heater to initialize or clean the cantilevered probe.

14. The method of claim 1, wherein the cantilevered probe comprises a resistive heater, further comprising heating the resistive heater to react a target chemical species.

15. The method of claim 1, wherein the cantilevered probe is one of a plurality of cantilevered probes in a cantilevered probe array.

16. The method of claim 15, wherein each of the plurality of cantilevered probes comprises a resistive heater.

17. The method of claim 16, further comprising independently heating at least a portion of the resistive heaters of the plurality of cantilevered probes.