Non-destructive stringer inspection apparatus and method
First Claim
1. A probe for inspecting a structure comprising:
- a housing configured for traveling over a first surface of the structure under inspection, and wherein the housing is further configured to span a cross-section of a portion of the structure that protrudes from the first surface of the structure wherein the portion of the structure that protrudes from the first surface of the structure forms a hat stringer, and wherein the housing is further configured to span a cross-section of the hat stringer; and
at least one inspection sensor carried by the housing for inspecting the structure as the probe is moved over the first surface of the structure.
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Accused Products
Abstract
A hat stringer inspection device permits continuous inspection of hat stringers as one or more probes are moved along the length of the hat stringer. Probes may be magnetically coupled to opposing surfaces of the structure, including, for example, where one of the probes is positioned inside the hat stringer and the probes are magnetically coupled across the surface of the hat stringer. The device may be autonomous with a feedback-controlled motor to drive the inspection device along the hat stringer. Magnetic coupling is also used to re-orient the position and/or alignment of the probes with respect to changes in the hat stringer or shapes, sizes, and configurations of hat stingers.
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Citations
20 Claims
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1. A probe for inspecting a structure comprising:
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a housing configured for traveling over a first surface of the structure under inspection, and wherein the housing is further configured to span a cross-section of a portion of the structure that protrudes from the first surface of the structure wherein the portion of the structure that protrudes from the first surface of the structure forms a hat stringer, and wherein the housing is further configured to span a cross-section of the hat stringer; and at least one inspection sensor carried by the housing for inspecting the structure as the probe is moved over the first surface of the structure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A probe for inspecting a structure comprising:
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a housing configured for traveling over a first surface of the structure under inspection, and wherein the housing is further configured to span a cross-section of a portion of the structure that protrudes from the first surface of the structure wherein the portion of the structure that protrudes from the first surface of the structure forms a shape selected from the group of;
a trapezoid, and a triangle, wherein the housing is further configured to span a cross-section of the shape, and wherein the housing comprises at least one angled portion corresponding to an angled surface of the shape and configured for riding along the angled surface of the shape as the housing travels over the first surface of the structure under inspection; andat least one inspection sensor carried by the housing for inspecting the structure as the probe is moved over the first surface of the structure.
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Specification