Semiconductor device, magnetic sensor, and magnetic sensor unit
First Claim
Patent Images
1. A semiconductor device, comprising:
- a semiconductor chip, on the surface of which are formed integrated circuitry and four or more sensor elements, electrically connected thereto;
a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry;
an electrode portion, positioned on the surface side of said semiconductor chip adapted for electrically connecting said semiconductor chip to external circuitry;
a wiring portion, electrically connecting said pad electrode to said electrode portion; and
,an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor elements, wiring portion, and electrode portion, in a state which exposes, at least, said electrode portion on the surface side of said semiconductor chip;
and whereinsaid electrode portion is placed in a position which does not overlap with said sensor elements in the thickness direction of said semiconductor chip and said four sensor elements are arranged so that each is parallel to a respective side of the semiconductor device.
0 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor device, comprising a semiconductor chip; a pad electrode; an electrode portion; a wiring portion. An insulating portion is formed from electrically insulating material, covering the surface of the semiconductor chip and sealing the sensor element, wiring portion and electrode portion, in a state which exposes at least the electrode portion on the surface of the semiconductor chip. The electrode portion is placed in a position which does not overlap with the sensor element in the thickness direction of the semiconductor chip.
-
Citations
9 Claims
-
1. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry and four or more sensor elements, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; an electrode portion, positioned on the surface side of said semiconductor chip adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portion; and
,an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor elements, wiring portion, and electrode portion, in a state which exposes, at least, said electrode portion on the surface side of said semiconductor chip; and wherein said electrode portion is placed in a position which does not overlap with said sensor elements in the thickness direction of said semiconductor chip and said four sensor elements are arranged so that each is parallel to a respective side of the semiconductor device. - View Dependent Claims (2, 4, 5)
-
-
3. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry a sensor element, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; an electrode portion, positioned on the surface side of said semiconductor chip adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portion; an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor elements, wiring portion, and electrode portion, in a state which exposes, at least, said electrode portion on the surface side of said semiconductor chip; and wherein said electrode portion is placed in a position which does not overlap with said sensor elements in the thickness direction of said semiconductor chip, wherein a plurality of said electrode portions are provided; a plurality of first lattice lines are supposed, extending in one direction on said surface of said semiconductor chip, arranged at substantially equal intervals so as to substantially equally divide a region of the surface located between an outermost two of the first lattice lines, and a plurality of second lattice lines are supposed, along said surface and intersecting with said first lattice lines, arranged at substantially equal intervals; each of the points of intersection of the first lattice lines and the second lattice lines are taken to be virtual placement positions for said electrode portions; among said electrode portions, one electrode portion which does not overlap with said sensor element in said thickness direction is placed in said virtual placement position; the other electrode portions among said electrode portions are placed in positions shifted, from said virtual placement positions, in a direction away from said sensor element along first lattice lines or along second lattice lines; and
,on said first lattice lines or on said second lattice lines, the number of electrode portions placed between adjacent lattice lines is one or less.
-
-
6. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry and a sensor element, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; a plurality of electrode portions, positioned on the surface side of said semiconductor chip said electrode portions adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portions; and
,an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor element, wiring portion, and electrode portions, in a state which exposes, at least, said electrode portions on the surface side of said semiconductor chip; and wherein said electrode portions comprise protruding portions which protrude from said insulating portion in the thickness direction of said semiconductor chip; and
,one protruding portion placed adjacently to said sensor element has a smaller protrusion length from said insulating portion compared with other protruding portions placed at a distance from said sensor element.
-
-
7. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry and a sensor element, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; a plurality of electrode portions, positioned on the surface side of said semiconductor chip said plurality of electrode portions adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portions; and
,an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor element, wiring portion, and electrode portions, in a state which exposes, at least, said electrode portions on the surface side of said semiconductor chip; and wherein said electrode portions comprise protruding portions which protrude from said insulating portion in the thickness direction of said semiconductor chip; and
,one protruding portion placed adjacently to said sensor element is formed from conductive material with a lower melting point compared with other protruding portions placed at a distance from said sensor element.
-
-
8. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry and a sensor element, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; a plurality of electrode portions, positioned on the surface side of said semiconductor chip said electrode portions adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portions; and
,an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor element, wiring portion, and electrode portions, in a state which exposes, at least, said electrode portions on the surface side of said semiconductor chip; and wherein said electrode portions comprise protruding portions which protrude from said insulating portion in the thickness direction of said semiconductor chip; said protruding portions comprise a substantially spherical core formed from a conductive material and a shell portion, covering the periphery of the core, and formed from a conductive material with a melting point lower than the melting point of said conductive material; and
,the core of one protruding portion placed adjacent to said sensor element is formed to be smaller than the cores of other protruding portions placed at a distance from said sensor element, and moreover diameters of the shell portions of said one protruding portion and of said other protruding portions are substantially equal.
-
-
9. A semiconductor device, comprising:
-
a semiconductor chip, on the surface of which are formed integrated circuitry and four or more sensor elements, electrically connected thereto; a pad electrode, formed on the surface side of said semiconductor chip, and electrically connected to at least said integrated circuitry; an electrode portion, positioned on the surface side of said semiconductor chip adapted for electrically connecting said semiconductor chip to external circuitry; a wiring portion, electrically connecting said pad electrode to said electrode portion; and an insulating portion, formed from electrically insulating material, which covers the surface of said semiconductor chip and seals said sensor elements, wiring portion, and electrode portion, in a state which exposes, at least, said electrode portion on the surface side of said semiconductor chip;
whereinsaid electrode portion is placed in a position which does not overlap with said sensor elements in the thickness direction of said semiconductor chip and said for sensor elements are arranged so that each is parallel to a respective side of the semiconductor device; and the electrode portion includes a solder ball protruding from the surface of the insulating portion, and the figures of the electrode portion projected onto a plane the normal to which is the mounting direction or the loading direction does not overlap the figures of the sensor element projected onto the same plane.
-
Specification