Drive, transmit & receive circuit for structural health monitoring systems

• US 7,267,008 B2
• Filed: 01/28/2005
• Issued: 09/11/2007
• Est. Priority Date: 01/28/2005
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Wilt, Nicholas, Gordon, Grant A.
• Primary Examiner(s): Williams; Hezron
• Assistant Examiner(s): MILLER, ROSE MARY
• Application Number:
  US11/046,259
• Publication Number:
  US 20060169046A1
• Time in Patent Office: 956 Days
• Field of Search: 736/43, 735/87, 735/94, 385 12- 13, 250/227.18, 356/477, 356/782
• US Class Current: 73/587
• CPC Class Codes: G01N 2291/0427 Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
• CPC Class Codes: G01N 2291/101 one transducer
• CPC Class Codes: G01N 2291/2694 Wings or other aircraft parts
• CPC Class Codes: G01N 29/041 on the surface of the material, e.g. using Lamb, Rayleigh or shear waves
• CPC Class Codes: G01N 29/343 pulse waves, e.g. particular sequence of pulses, bursts
• CPC Class Codes: G01N 29/36 Detecting the response signal , e.g. electronic circuits specially adapted therefor

Abstract

A transducer for use in a structural health monitoring system includes a single transducer element. The transducer includes a transmit assembly coupled to the single transducer element. This assembly is configured to produce a multi-cycle square wave drive signal for stimulating the transducer. Additionally, a transmit/receive switch coupled to the single transducer element is provided. This assembly is configured to isolate the drive signal from the receive assembly used to sense the electrical signal generated from any received elastic waves.

Claims

1. A transducer for use in a structural health monitoring system, comprising:

a transducer element including a first side and a second side and configured to be coupled to a test structure;

a transmit assembly including a voltage driver coupled to the first side and the second side of the transducer element, the voltage driver configured to produce a drive signal to the first side and an inverse of the drive signal to the second side;

a receive assembly coupled to the transducer element, the receive assembly configured to receive mechanical pulses from the test structure; and

a transmit/receive switch coupled to the receive assembly and the transmit assembly, the transmit/receive switch open when the transmit assembly is providing the drive signal.

2. The transducer of claim 1 wherein the transmit/receive switch comprises at least one diode that is reverse biased when the drive pulse exceeds a reverse bias threshold.

3. The transducer of claim 2 further comprises a voltage source coupled to the at least one diode, the voltage source configured to forward bias the at least one diode.

4. The transducer of claim 1 wherein the transducer element is a piezoelectric element.

5. The transducer of claim 4 wherein the piezoelectric element is a piezoelectric ceramic.

6. The transducer of claim 1 wherein the transducer element is configured to produce Lamb waves in the test structure.

7. The transducer of claim 1 wherein the voltage driver is configured to provide a multi-cycle square wave drive signal to the first side of the transducer element and an inverted multi-cycle square wave drive signal to the second side of the transducer element.

8. The transducer of claim 7 wherein the voltage driver comprises an inverter to invert the multi-cycle square wave drive signal to form the inverted multi-cycle square wave drive signal provided to the second side of the transducer element.

9. The transducer of claim 1 wherein the transmit assembly produces a 10 v square wave.

10. The transducer of claim 1 wherein the test structure is an aircraft skin.

26. The transducer of claim 1 wherein the transducer structural health monitoring system is coupled to an aircraft skin.

11. A structural health monitoring system for use as an imbedded monitoring system comprising:

a transducer element including a first side and a second side and configured to be coupled to a test material;

a transmit assembly including a voltage driver coupled to the first side and the second side of the transducer element, the voltage driver configured to produce a drive pulse to the first side and an inverse of the drive pulse to the second side;

a receive assembly coupled to the transducer element, the receive assembly configured to receive mechanical pulses from the test material and generate characteristic data relating to the test material in response thereto;

a transmit/receive switch coupled between the receive assembly and the transmit assembly, the transmit/receive switch open when the transmit assembly is providing the drive pulse; and

a processor coupled to the receive assembly, the processor configured to evaluate the characteristic data generated by the receive assembly.

12. The system of claim 11 wherein the transmit/receive switch comprises a diode that becomes reverse biased and acts as an open circuit when the drive pulse exceeds a reverse bias threshold.

13. The system of claim 12 further comprising a voltage source coupled to the at least one diode, the voltage source configured to forward bias the at least one diode.

14. The system of claim 11 wherein the transducer element is a piezoelectric element.

15. The system of claim 14 wherein the piezoelectric element is a piezoelectric ceramic.

16. The system of claim 11 wherein the transducer element is configured to produce lamb waves in the test material.

17. The system of claim 11 wherein the transmit assembly further comprises a pulse generator coupled to the first side of the transducer element and the second side of the transducer element, the pulse generator comprising:

a signal source configured to generate a voltage waveform; and

a voltage driver coupled to the signal source, the voltage driver configured to present an inverse of the voltage waveform to the first side of the transducer element and the waveform to the second side of the transducer element.

18. The system of claim 17 wherein the processor is configured to activate the voltage driver to initiate a pulse.

19. The system of claim 11 wherein the transmit assembly produces a 10 v square wave.

20. The system of claim 11 wherein the test material is an aircraft skin.

21. A transducer having a single transducer element for use in a structural health monitoring system permanently mounted to a test material, the transducer comprising:

a transmit assembly coupled to the single transducer element, the transmit assembly comprising;

a voltage driver coupled to a first side of the transducer element and a second side of the transducer element, the voltage driver configured to provide a drive pulse comprising an alternate voltage to the first side of the transducer element and then to the second side of the transducer element;

a receive assembly coupled to the single transducer element, the receive assembly configured to receive mechanical pulses from the test material; and

a transmit/receive switch coupled to the receive assembly and the transmit assembly, the transmit/receive switch open when the transmit assembly is providing a drive pulse.

22. The transducer of claim 21 wherein the transmit/receive switch comprises at least one diode that is reverse biased when the drive pulse exceeds a reverse bias threshold.

23. The transducer of claim 22 further comprises a voltage source coupled to the at least one diode, the voltage source configured to forward bias the at least one diode.

24. The transducer of claim 21 wherein the transducer element is configured to produce and detect lamb waves in the test material.

25. The transducer of claim 21 wherein the voltage driver further comprises an inverter configured to invert a voltage wave to form an inverted voltage waveform, the inverted voltage waveform provided to a first side of the transducer element and wherein an uninverted voltage waveform is provided to the second side of the transducer element.