Shielded probe for testing a device under test
First Claim
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1. A probe comprising:
- (a) a flexible membrane;
(b) an elongate conductor suitable to be electrically interconnected to a test signal supported by a first side of said membrane;
(c) a conductive member suitable to be electrically interconnected to a ground signal supported by a second side of said membrane wherein said conductive member is under a majority of the length of said elongate conductor;
(d) a conductive path between said first side of said membrane and said second side of said membrane in a manner free from an air gap between the conductive path and the end of said membrane for at least a majority of the thickness of said membrane and said electrically connected to the elongate conductor and free from electrical interconnection with said conductive member; and
(e) a contact electrically interconnected to said conductive path for testing a device under test.
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Abstract
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a probe contact electrically connected to the conductive path.
788 Citations
53 Claims
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1. A probe comprising:
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(a) a flexible membrane; (b) an elongate conductor suitable to be electrically interconnected to a test signal supported by a first side of said membrane; (c) a conductive member suitable to be electrically interconnected to a ground signal supported by a second side of said membrane wherein said conductive member is under a majority of the length of said elongate conductor; (d) a conductive path between said first side of said membrane and said second side of said membrane in a manner free from an air gap between the conductive path and the end of said membrane for at least a majority of the thickness of said membrane and said electrically connected to the elongate conductor and free from electrical interconnection with said conductive member; and (e) a contact electrically interconnected to said conductive path for testing a device under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A probe comprising:
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(a) a non-rigid membrane supporting an elongate conductor on a first side of said membrane and a conductive member supported by a second side of said membrane wherein said conductive member is under a majority of the length of said elongate conductor; (b) a conductive path between said first side of said membrane and said second side of said membrane in a region within the periphery of said membrane for at least a majority of the thickness of said membrane said conductive path electrically connected to said elongate conductor and free from electrical interconnection with said conductive member; and (c) a contact electrically interconnected to said conductive path for testing a device under test. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53)
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Specification