Method and system for remote sensing of optical instruments and analysis thereof

• US 7,271,898 B2
• Filed: 01/19/2005
• Issued: 09/18/2007
• Est. Priority Date: 01/19/2005
• Status: Active Grant

• Current Assignee: BAE Systems Information and Electronic Systems Integration Incorporated (BAE Systems Plc)
• Original Assignee: BAE Systems Information and Electronic Systems Integration Incorporated (BAE Systems Plc), Electronic Systems Integration Inc.
• Inventors: Weber, Jonathan L.
• Primary Examiner(s): Nguyen; Sang H.
• Application Number:
  US11/040,754
• Publication Number:
  US 20060158646A1
• Time in Patent Office: 972 Days
• Field of Search: 356317-320, 356/213, 250/458.1, 250/459.1, 250/461.1, 250/339.01, 250/339.11
• US Class Current: 356/318
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma

Abstract

A sensor is provided for analyzing an object at a focal point of a lens. The sensor includes a focused radiant energy source directed at the lens. The focused radiant energy source transmits a first beam of energy to the lens, vaporizing a portion of the object at the focal point of the lens. A second beam of energy is emitted from the vaporization of the object. A spectrometer is positioned to receive the second beam of energy emitted from the object. The second beam of energy is at least partially transmitted anti-parallel to the first beam of energy.

Claims

1. A sensor for analyzing an object at a focal point of a lens, the sensor comprising:

a focused radiant energy source directed at the lens capable of generating a first beam of energy wherein the first beam is of sufficient intensity, when focused by the lens, to vaporize at least a portion of the object;

a spectrometer positioned to receive a second beam of energy emitted from the object, wherein the second beam of energy is at least partially transmitted anti-parallel to the first beam of energy and wherein the second beam of energy comprises a spectral emission from a vaporized portion of the object;

a radiant energy search beam source; and

a detector for detecting a retro-reflected search beam which is in excess of a preselected radiant flux density level thereby indicating the presence of the object.

2. The sensor of claim 1, further comprising logic configured to determine whether the spectral emission has a focus optical gain.

3. The sensor of claim 1, further comprising logic configured to compare the spectral emission of the second beam to spectral emission properties of different materials, thereby analyzing the object.

4. The sensor of claim 1 further comprising a mirror positionable to direct the retro-reflected search beam to the detector and to direct the second beam to the spectrometer.

5. The sensor of claim 1 wherein the radiant energy search beam source and the focused radiant energy source are one combined radiant energy source.

6. The sensor of claim 5 wherein the combined radiant energy source is a laser.

7. The sensor of claim 1 wherein the spectrometer is a slitless spectrometer.

8. The sensor of claim 1 further comprising a memory device on which is stored spectral emission properties of different materials.

9. The sensor of claim 1 wherein the object is a tracking optical device.

10. A method of analyzing an object at a focal point of a lens, the method comprising the steps of:

transmitting a first radiant energy beam at the lens;

focusing the first radiant energy beam with the lens;

vaporizing a portion of the object at the focal point of the lens;

receiving a second beam of energy, emitted from the vaporized portion of the object, at a spectrometer, wherein the second beam of energy is at least partially transmitted anti-parallel to the first beam of energy;

radiating an energy search beam at the lens; and

detecting a retro-reflected search beam which is in excess of a preselected radiant flux density level thereby indicating the presence of the object.

11. The method of claim 10, further comprising the step of comparing a spectral emission of the second beam to spectral emission properties of different materials, thereby analyzing the object.

12. The method of claim 10 further comprising the step of directing the first radiant energy beam at a location from which a retro-reflected search beam was detected thereby analyzing the detected object.

13. The method of claim 10 further comprising the step of scanning the energy search beam over a region to locate the lens.

14. The method of claim 10 wherein the step of vaporizing vaporizes a relatively small portion of the object whereby operability of the object is unaffected.

15. The method of claim 10 further comprising the step of identifying a tracking optical device.