Systems and methods for monitoring and storing performance and maintenance data related to an electrical component
First Claim
1. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising:
- a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein said data collection device is encased in a housing for protecting said data collection device, wherein said housing is independent of any housing of the electrical system, such that said data collective device is a self-contained device; and
a test device capable of performing at least a test operation on the electric component, wherein said test device stores information concerning the test operation in the memory of said data collection device, such that information concerning the test operation are resident with the electrical component.
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Abstract
The present invention provides systems and methods for testing and storage of information related to a component. A data collection device having a memory is fixedly connected to the component. A test device communicates with the data collection device to store test data concerning the component in the data collection device. The test device also performs analysis of the test data and provides information concerning the health and maintenance history of the component. The present invention also provides systems and methods for determining the current drawn or supplied by electrical components connected in parallel in an electrical system. A current sensor located between the electrical components determines the current supply or draw of one of the electrical components, while a current sensor between the electrical components and the remainder of the electrical system determine a cumulative current draw or supply by both the electrical components.
98 Citations
16 Claims
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1. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising:
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a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein said data collection device is encased in a housing for protecting said data collection device, wherein said housing is independent of any housing of the electrical system, such that said data collective device is a self-contained device; and a test device capable of performing at least a test operation on the electric component, wherein said test device stores information concerning the test operation in the memory of said data collection device, such that information concerning the test operation are resident with the electrical component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising:
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a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein said data collection device is encased in a housing for protecting said data collection device, and wherein said housing is positioned on a surface of the electrical component and a lamination is applied over the housing and at least a portion of the surface of the electrical component to thereby secure said housing to said electrical component; and a test device capable of performing at least a test operation on the electric component, wherein said test device stores information concerning the test operation in the memory of said data collection device, such that information concerning the test operation are resident with the electrical component.
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15. A system for testing and data storage of information related to at least one component of an electrical system, wherein said system comprises:
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a memory device for storing information related to tests performed on said electrical component; a transceiver in electrical communication with said memory device, wherein said transceiver transmits data stored in said memory device to a test device used to test the said electrical component and for receiving data from the test device for storage in said memory device; and a housing surrounding said memory device and said transceiver, wherein said housing is fixedly connected to the component, such that information stored in said memory device concerning the component is resident on the component, wherein said housing is independent of any housing of the electrical system, such that said data collective device is a self-contained device. - View Dependent Claims (16)
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Specification