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Advanced optics for rapidly patterned laser profiles in analytical spectrometry

  • US 7,282,706 B2
  • Filed: 02/11/2005
  • Issued: 10/16/2007
  • Est. Priority Date: 02/12/2004
  • Status: Expired due to Fees
First Claim
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1. A method for inspecting a sample comprising the steps of:

  • providing a wavefront of photons from a photon source;

    transforming the wavefront of photons into a uniform intensity profile;

    selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern using a digital micro-mirror array;

    focusing said photon pattern on at least a portion of a sample; and

    ,desorbing, and optionally ionizing, at least a portion of said sample.

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