×

Micromachined double tuning-fork gyrometer with detection in the plane of the machined wafer

  • US 7,284,429 B2
  • Filed: 08/31/2004
  • Issued: 10/23/2007
  • Est. Priority Date: 09/09/2003
  • Status: Active Grant
First Claim
Patent Images

1. A gyrometer based on a planar vibrating structure, comprising:

  • four moving assemblies placed at the vertices of a virtual rectangle in order to allow a rotation measurement with minimal perturbations due to an excitation movement,each moving assembly being coupled to two moving assemblies located at neighboring vertices via a coupling structure in order to allow transfer of mechanical vibration energy between them, each moving assembly includinga first inertial moving element connected to the coupling structure and intended to vibrate in two orthogonal directions in the plane of the vibrating structure, a first direction, called the excitation direction, anda second direction, called the detection direction, a second moving element intended to vibrate in the detection direction without permitting movement of the second element in the excitation direction and connected, on one side, to the first moving element, and, on the other side, to anchoring zones via linking means which allow transmission to the second moving element of the vibration movement of the first moving element in the detection direction.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×