Arrayed sensor measurement system and method

• US 7,286,221 B2
• Filed: 12/21/2004
• Issued: 10/23/2007
• Est. Priority Date: 06/24/2003
• Status: Expired due to Fees

• Current Assignee: Corning Incorporated
• Original Assignee: Corning Incorporated
• Inventors: Yuen, Po Ki, Fontaine, Norman H., Mozdy, Eric J., Caracci, Stephen J.
• Primary Examiner(s): Toatley, Jr.; Gregory J.
• Assistant Examiner(s): Geisel; Kara
• Application Number:
  US11/019,439
• Publication Number:
  US 20050099622A1
• Time in Patent Office: 1,036 Days
• Field of Search: 356/300, 356/364, 356/445
• US Class Current: 356/300
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 2201/04 Batch operation; multisample devices
• CPC Class Codes: G01N 2201/10 Scanning
• CPC Class Codes: G02B 27/1086 operating by diffraction only

Abstract

Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.

Claims

1. An optical interrogation system comprising:

a launch system for generating an array of light beams and for simultaneously controlling the numerical aperture, focus, and polarization of said light beams while also directing all or a predetermined number of said light beams towards a large area two-dimensional specimen array; and

a receive system for receiving all or a predetermined number of responses from said light beams reflected from sensors or specimens in said large area two-dimensional specimen array, wherein said receive system has a far-field diffraction measurement configuration where a reverse auto-collimating optic simultaneously receives all or the predetermined number of said light beams reflected from sensors in the large area two-dimensional specimen array and focuses those light beams at a small area detector in the receive system.

2. The optical interrogation system of claim 1, wherein said receive system is configured to enable fluorescence assay measurements, infrared and ultra-violet absorption spectroscopy, Fourier transform infrared absorption spectroscopy, Raman spectroscopy, reflection spectroscopy or surface plasmon resonance spectroscopy.

3. The optical interrogation system of claim 1, wherein:

said launch system includes a mask that blocks a certain number of said light beams from reaching selected sensors or specimens in the large area two-dimensional specimen array;

or

said receive system includes a mask that blocks a certain number of said light beams reflected from selected sensors or specimens in the large area two-dimensional specimen array.

4. The optical interrogation system of claim 1, wherein grating based sensors are located in the large area two-dimensional specimen array.

5. The optical interrogation system of claim 1, wherein said large area two-dimensional specimen array is a multiwell plate.

6. An optical interrogation system comprising:

a launch system for generating an array of light beams and for simultaneously controlling the numerical aperture, focus, and polarization of said light beams while also directing all or a predetermined number of said light beams towards a large area two-dimensional specimen array; and

a receive system for receiving all or a predetermined number of responses from said light beams reflected from sensors or specimens in the large area two-dimensional specimen array, wherein said receive system has an anamorphic re-focusing configuration where a cylindrical optic is inserted in a receive path either prior to or after a spherical optic to enable parallel detection and partial optical integration of all or the predetermined number of said light beams reflected from selected sensors in the large area two-dimensional specimen array.

7. An optical interrogation system comprising:

a launch system for generating an array of light beams and for simultaneously controlling the numerical aperture, focus, and polarization of said light beams while also directing all or a predetermined number of said light beams towards a large area two-dimensional specimen array;

a receive system for receiving all or a predetermined number of responses from said light beams reflected from sensors or specimens in the large area two-dimensional specimen array; and

an angular measurement system for measuring a change in angular tilt of a plane of the large area two-dimensional specimen array whenever the large area two-dimensional specimen array is repositioned or removed and returned.

8. An optical interrogation system comprising:

a launch system for generating an array of light beams and for simultaneously controlling the numerical aperture, focus, and polarization of said light beams while also directing all or a predetermined number of said light beams towards a large area two-dimensional specimen array;

a receive system for receiving all or a predetermined number of responses from said light beams reflected from sensors or specimens in the large area two-dimensional specimen array; and

an aperture array used to prevent ghost reflections of light beams from a beamsplitter and other optical elements from reaching the large area two-dimensional specimen array.

9. A method for interrogating one or more specimens in a large area two-dimensional specimen, said method comprising the steps of:

using a launch system to generate an array of light beams and direct all or a predetermined number of said light beams towards said large area two-dimensional specimen array; and

using a receive system to receive all or a predetermined number of said light beams reflected from said large area two-dimensional specimen array, wherein said receive system has a far-field diffraction measurement configuration where a reverse auto-collimating optic simultaneously receives all or the predetermined number of said light beams reflected from sensors in the large area two-dimensional specimen array and focuses those light beams at a small area detector.

10. The method of claim 9, wherein said receive system is configured to enable fluorescence assay measurements, infrared and ultra-violet absorption spectroscopy, Fourier transform infrared absorption spectroscopy, Raman spectroscopy, reflection spectroscopy or surface plasmon resonance spectroscopy.

11. The method of claim 9, wherein:

said launch system includes a mask that blocks a certain number of said light beams from reaching selected specimens in the large area two-dimensional specimen array;

or

said receive system includes a mask that blocks a certain number of said light beams reflected from selected specimens in the large area two-dimensional specimen array.

12. The method of claim 9, wherein grating based sensors are located in the large area two-dimensional specimen array.

13. The method of claim 9, wherein said large area two-dimensional specimen array is a multiwell plate.

14. A method for interrogating one or more specimens in a large area two-dimensional specimen, said method comprising the steps of:

using a launch system to generate an array of light beams and direct all or a predetermined number of said light beams towards said large area two-dimensional specimen array; and

using a receive system to receive all or a predetermined number of said light beams reflected from said large area two-dimensional specimen array, wherein said receive system has an anamorphic re-focusing configuration where a cylindrical optic is inserted in a receive path either prior to or after a spherical optic to enable parallel detection of all or the predetermined number of said light beams reflected from selected sensors in the large area two-dimensional specimen array.

15. A method for interrogating one or more specimens in a large area two-dimensional specimen, said method comprising the steps of:

using a launch system to generate an array of light beams and direct all or a predetermined number of said light beams towards said large area two-dimensional specimen array;

using a receive system to receive all or a predetermined number of said light beams reflected from said large area two-dimensional specimen array; and

using an angular measurement system to measure a change in angular tilt of a plane of said large area two-dimensional specimen array whenever said large area two-dimensional specimen array is repositioned or removed and returned.

16. A method for interrogating one or more specimens in a large area two-dimensional specimen, said method comprising the steps of:

using a launch system to generate an array of light beams and direct all or a predetermined number of said light beams towards said large area two-dimensional specimen array;

using a receive system to receive all or a predetermined number of said light beams reflected from said large area two-dimensional specimen array; and

using an aperture array to prevent ghost reflections of light beams from a beamsplitter and other optical elements from reaching said large area two-dimensional specimen array.