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Pattern matching method and apparatus

  • US 7,295,980 B2
  • Filed: 08/31/2006
  • Issued: 11/13/2007
  • Est. Priority Date: 10/28/1999
  • Status: Expired due to Fees
First Claim
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1. A feature comparison apparatus comprising:

  • a receiver operable to receive first and second sequences of features;

    an aligner operable to align features of the first sequence with features of the second sequence to form a number of aligned pairs of features;

    a comparator operable to compare the features of each aligned pair of features formed by said aligner to generate a comparison score representative of the similarity between the aligned pair of features; and

    a combiner operable to combine the comparison scores for all the aligned pairs of features to provide a measure of the similarity between the first and second sequences of features;

    wherein said comparator comprises;

    a first sub-comparator operable to compare, for each aligned pair, the first sequence feature in the aligned pair with each of a plurality of features taken from a set of predetermined features to provide a corresponding plurality of intermediate comparison scores representative of the similarity between said first sequence feature and the respective features from the set;

    a second sub-comparator operable to compare, for each aligned pair, the second sequence feature in the aligned pair with each of said plurality of features from the set to provide a further corresponding plurality of intermediate comparison scores representative of the similarity between said second sequence feature and the respective features from the set; and

    a calculator operable to calculate said comparison score for the aligned pair by combining said pluralities of intermediate comparison scores.

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