Fast code acquisition method based on signed-rank statistic

• US 7,298,779 B2
• Filed: 05/28/2002
• Issued: 11/20/2007
• Est. Priority Date: 05/20/2002
• Status: Expired due to Fees

• Current Assignee: Korea Advanced Institute of Science and Technology
• Original Assignee: Korea Advanced Institute of Science and Technology
• Inventors: Kim, Hong Gil, Song, Lick Ho, Jung, Chang Yong
• Primary Examiner(s): Payne; David C.
• Assistant Examiner(s): Wong; Linda
• Application Number:
  US10/156,358
• Publication Number:
  US 20030223478A1
• Time in Patent Office: 2,002 Days
• Field of Search: None
• US Class Current: 375/149
• CPC Class Codes: H04B 1/70755 Setting of lock conditions, e.g. threshold
• CPC Class Codes: H04J 13/0022 PN, e.g. Kronecker

Abstract

The present invention relates to the fast code acquisition methods based on signed-rank statistic. In more detail, it presents novel detectors required for PN (PN) code acquisition in DS/SS system.

In accordance with the present invention, first, the LOR (LOR) detector is derived and then the LSR (LSR) and MSR (MSR) detectors using approximate score functions are proposed. It is compared the single-dwell scheme without the verification mode using the proposed LSR and MSR detectors with that using the conventional squared-sum (SS) and modified sign (MS) detectors.

Claims

1. A fast code acquisition method comprising the steps of:

preparing a locally optimum rank (LOR) detector;

determining test statistics of the LOR detector based on signed-rank statistics according to the following equations;

2. A fast code acquisition method in accordance with claim 1, further comprising the steps of:

preparing a locally suboptimum rank (LSR) detector;

determining test statistics of the LSR detector according to the following equation;

3. A fast code acquisition method in accordance with claim 2, further comprising steps of:

preparing a modified signal-rank (MSR) detector;

determining test statistics of the MSR detector according to the following equation;