Productivity enhancing thermal sprayed yttria-containing coating for plasma reactor
First Claim
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1. A process of manufacturing a component of a semiconductor processing apparatus, comprising:
- anodizing a surface of an unroughened aluminum substrate;
sealing the anodized aluminum surface; and
applying a coating consisting essentially of yttria directly over the sealed anodized surface of the aluminum substrate by thermal spraying, the coating comprising an outermost surface of the component.
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Abstract
Components of semiconductor processing apparatus comprise thermal sprayed yttria-containing coatings that provide erosion, corrosion and/or corrosion-erosion resistance in plasma atmospheres. The coatings can protect substrates from physical and/or chemical attack.
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Citations
18 Claims
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1. A process of manufacturing a component of a semiconductor processing apparatus, comprising:
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anodizing a surface of an unroughened aluminum substrate; sealing the anodized aluminum surface; and applying a coating consisting essentially of yttria directly over the sealed anodized surface of the aluminum substrate by thermal spraying, the coating comprising an outermost surface of the component. - View Dependent Claims (2, 3)
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4. A process of etching a semiconductor wafer, comprising:
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placing a semiconductor wafer in a chamber of a plasma etch reactor, the plasma etch reactor comprising at least one component including an aluminum substrate having a sealed anodized surface and a thermal sprayed coating consisting essentially of yttria disposed directly over the sealed anodized surface, the coating forming an outermost surface of the component; introducing a process gas into the chamber; generating a plasma from the process gas; and etching the semiconductor wafer with the plasma, wherein the coating is exposed to the plasma during the etching. - View Dependent Claims (5, 6, 7, 8, 9)
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10. A process of reducing contamination of a semiconductor wafer by erosion of a component in a chamber of a plasma etch reactor during etching of the semiconductor wafer in the plasma etch reactor, comprising:
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placing a semiconductor wafer in a chamber of a plasma etch reactor, the plasma etch reactor comprising at least one component including an aluminum substrate having a sealed anodized surface and a thermal sprayed coating consisting essentially of yttria disposed directly over the sealed anodized surface, the coating forming an outermost surface of the component; introducing a process gas into the chamber, the process gas being erosive with respect to the aluminum substrate material; generating a plasma from the process gas; and etching the semiconductor wafer with the plasma while exposing the coating to the plasma, wherein the coating minimizes contamination of the semiconductor wafer by the substrate material and yttria during the etching. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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Specification