System and method for cleaning in-process sensors

• US 7,300,630 B2
• Filed: 09/27/2002
• Issued: 11/27/2007
• Est. Priority Date: 09/27/2002
• Status: Active Grant

• Current Assignee: The Chemours Company FC, LLC (The Chemours Company)
• Original Assignee: E. I. du Pont de Nemours and Company (Corteva, Inc.)
• Inventors: Helberg, Lisa Edith, Elkins, Thomas Shields, Cronin, James Timothy, Strzelecki, Angela Ruth
• Primary Examiner(s): Warden; Jill
• Assistant Examiner(s): Siefke; Samuel P.
• Application Number:
  US10/256,672
• Publication Number:
  US 20040060576A1
• Time in Patent Office: 1,887 Days
• Field of Search: 422/1, 422/99, 422/102
• US Class Current: 422/82
• CPC Class Codes: B08B 3/02 Cleaning by the force of jets or sprays
• CPC Class Codes: B08B 5/02 Cleaning by the force of jets, e.g. blowing-out cavities airguns or nozzles per se B05B1/005
• CPC Class Codes: G01N 2021/151 Gas blown
• CPC Class Codes: G01N 2021/651 Cuvettes therefore
• CPC Class Codes: G01N 21/15 Preventing contamination of the components of the optical system or obstruction of the light path
• CPC Class Codes: G01N 21/35 using infrared light G01N21/39 takes precedence
• CPC Class Codes: G01N 21/3577 for analysing liquids, e.g. polluted water
• CPC Class Codes: G01N 21/359 using near infrared light
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: G01N 21/85 Investigating moving fluids or granular solids

Abstract

A cleaning system and method for in-process sensors wherein a scouring jet discharges process fluid as the cleaning agent to remove solids and other contaminants from the surface of the sensor.

Claims

1. A cleaning system for an in-process sensor, comprising:

a. a reaction vessel containing a process fluid and having a sampling system connected thereto by way of a conduit for withdrawing at least a portion of the process fluid from the reaction vessel, and passing the process fluid through the sampling system and returning the process fluid to the reaction vessel;

b. a sensor, wherein the sensor has a surface, which surface is positioned such that it contacts the process fluid; and

c. a scouring jet having an inlet and an outlet, at least the outlet being positioned inside the sampling system;

wherein the process fluid is in contact with the inlet of the scouring jet and, wherein the jet is positioned relative to the sensor such that discharge from the outlet consists of the process fluid which impinges on the surface of the sensor.

2. The cleaning system of claim 1 further comprising one or more valves located between the inlet to the scouring jet and The outlet of The scouring jet.

3. The cleaning system of claim 1 wherein the sensor is an Infrared, Raman or Near Infrared spectroscopic instrument.

4. The cleaning system of claim 3 wherein the instrument has a probe.

5. The cleaning system of claim 4 wherein the probe has a window in contact with the process fluid.

6. The cleaning system of claim 1 wherein the sensor is an Infrared spectroscopic instrument.

7. The cleaning system of claim 1 wherein me sampling system comprises a recycle loop.

8. The cleaning system of claim 1 wherein the sampling system comprises an infrared analyzer cell.