Method for estimating the remaining life span of an X-ray radiator

• US 7,302,041 B2
• Filed: 08/20/2004
• Issued: 11/27/2007
• Est. Priority Date: 08/22/2003
• Status: Active Grant

• Current Assignee: Siemens Healthineers AG (Siemens AG)
• Original Assignee: Siemens AG
• Inventors: Freudenberger, Jo, Schardt, Peter, Deuringer, Josef, Schild, Markus
• Primary Examiner(s): Yun; Jurie
• Application Number:
  US10/922,674
• Publication Number:
  US 20070189463A1
• Time in Patent Office: 1,194 Days
• Field of Search: 378/91, 378/98, 378/98.5, 378/101, 378/117, 378/118, 378/207
• US Class Current: 378/118
• CPC Class Codes: G01R 31/257 Testing of beam-tubes, e.g. cathode-ray tubes, image pick-up tubes of channel image intensifier arrays G01R31/252; of transit time tubes G01R31/255
• CPC Class Codes: H05G 1/28 Measuring or recording actual exposure time; Counting number of exposures; Measuring required exposure time

Abstract

In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a memory. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory.

Claims

1. A method for estimating a remaining life span of an X-ray radiator, comprising the steps of:

determining, under defined test conditions and at respective time intervals, a measurement value from an X-ray radiator, operationally installed in an X-ray apparatus, indicative of a remaining life span of said X-ray radiator;

storing said measurement value in a memory;

determining a forecasted progression of future measurement values for said X-ray radiator based on said measurement value and based on previous measurement values, determined under said test conditions at earlier times and stored in said memory; and

determining a forecasted remaining life span of said X-ray radiator based on said forecasted progression and a limit value, stored in said memory, associated with said X-ray radiator.

2. A method as claimed in claim 1 comprising:

determining a plurality of different measurement values under said defined test conditions and respective time intervals, for said X-ray radiator;

for each of said measurement values determining a forecasted progression of future measurement values based on the respective measurement value and previous respective measurement values determined at earlier times under said test conditions and stored in said memory, thereby providing a plurality of forecasted progressions; and

determining said forecasted remaining life span based on said plurality of forecasted progressions and a limit value, stored in said memory, for each of said forecasted progressions for said X-ray radiator.

3. A method as claimed in claim 1 comprising determining said limit value for said X-ray radiator prior to installation of said X-ray radiator in said X-ray apparatus.

4. A method as claimed in claim 3 wherein said previous measurement values include a measurement value obtained prior to installation of said X-ray radiator in said X-ray apparatus, and determining said forecasted progression by comparing said measurement value determined under said test conditions and at said respective time intervals with said measurement value obtained prior to installation.

5. A method as claimed in claim 1 comprising locating said memory at said X-ray radiator.

6. A method as claimed in claim 5 wherein said X-ray apparatus includes a data processor disposed at said X-ray apparatus, and comprising accessing said memory at said X-ray radiator by said data processor, and determining the forecasted remaining life span of the X-ray radiator in said data processor.

7. A method as claimed in claim 6 wherein said data processor is a first processor, and comprising establishing a communication link between said first data processor and a second data processor, located remote from said X-ray apparatus, via a communication network.

8. A method as claimed in claim 1 wherein said X-ray apparatus includes a first data processor, and comprising establishing a communication link between said first data processor and a second data processor, located remote from said X-ray apparatus, via a communications network, disposing said memory at said second data processor, transferring said measurement values from said first data processor to said memory via said communication network, and determining said forecasted remaining life span of said X-ray radiator in said second data processor.

9. A method as claimed in claim 1 comprising automatically planning a replacement of said X-ray radiator when said forecasted remaining life span of said X-ray radiator falls below a predetermined value.

10. A method for estimating a remaining life span of an X-ray radiator, comprising the steps of:

determining, under defined test conditions and at respective time intervals, a measurement value from an X-ray radiator, operationally installed in an X-ray apparatus, indicative of a remaining life span of said X-ray radiator; and

determining a forecasted remaining life span of said X-ray radiator from said measurement value based on a characteristic curve for said X-ray radiator stored in a memory, and based on a limit value associated with said X-ray radiator stared in said memory.

11. A method as claimed in claim 10 comprising:

determining a plurality of different measurement values under said defined test conditions and respective time intervals, for said X-ray radiator;

for each of said measurement values determining a forecasted progression of future measurement values based on the respective measurement value and previous respective measurement values determined at earlier times under said test conditions and stored in said memory, thereby providing a plurality of forecasted progressions; and

determining said forecasted remaining life span based on said plurality of forecasted progressions and a further limit value, stored in said memory, for each of said forecasted progressions for said X-ray radiator.

12. A method as claimed in claim 10 comprising determining said limit value for said X-ray radiator prior to installation of said X-ray radiator in said X-ray apparatus.

13. A method as claimed in claim 12 wherein said previous measurement values include a measurement value obtained prior to installation of said X-ray radiator in said X-ray apparatus, and determining said forecasted progression by comparing said measurement value determined under said test conditions and at said respective time intervals with said measurement value obtained prior to installation.

14. A method as claimed in claim 10 comprising locating said memory at said X-ray radiator.

15. A method as claimed in claim 14 wherein said X-ray apparatus includes a data processor disposed at said X-ray apparatus, and comprising accessing said memory at said X-ray radiator by said data processor, and determining the forecasted remaining life span of the X-ray radiator in said data processor.

16. A method as claimed in claim 15 wherein said data processor is a first processor, and comprising establishing a communication link between said first data processor and a second data processor, located remote from said X-ray apparatus, via a communication network.

17. A method as claimed in claim 10 wherein said X-ray apparatus includes a first data processor, and comprising establishing a communication link between said first data processor and a second data processor, located remote from said X-ray apparatus, via a communications network, disposing said memory at said second data processor, transferring said measurement values from said first data processor to said memory via said communication network, and determining said forecasted remaining life span of said X-ray radiator in said second data processor.

18. A method as claimed in claim 10 comprising automatically planning a replacement of said X-ray radiator when said forecasted remaining life span of said X-ray radiator falls below a predetermined value.