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Method and system for image processing for structured light profiling of a part

  • US 7,302,109 B2
  • Filed: 08/28/2003
  • Issued: 11/27/2007
  • Est. Priority Date: 08/28/2003
  • Status: Expired due to Fees
First Claim
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1. An image processing method for structured light profiling, said method comprising:

  • sampling an image of a structured light pattern to obtain an intensity distribution;

    selecting a plurality of sets of sampled points from the intensity distribution, wherein each of the respective sets comprises a plurality of sampled points;

    fitting each of the sets of sampled points to a respective Gaussian distribution function; and

    filtering the Gaussian distribution functions to select a representative distribution function for the intensity distribution.

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