Spin microscope based on optically detected magnetic resonance

• US 7,305,869 B1
• Filed: 04/11/2005
• Issued: 12/11/2007
• Est. Priority Date: 04/12/2004
• Status: Expired due to Fees

• Current Assignee: U S Department of Energy
• Original Assignee: U S Department of Energy
• Inventors: Chernobrod, Boris M., Berman, Gennady P.
• Primary Examiner(s): RAEVIS, ROBERT R
• Application Number:
  US11/102,626
• Time in Patent Office: 974 Days
• Field of Search: None
• US Class Current: 73/105
• CPC Class Codes: B82Y 15/00 Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
• CPC Class Codes: B82Y 25/00 Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 30/02 Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
• CPC Class Codes: G01Q 60/02 Multiple-type SPM, i.e. involving more than one SPM techniques
• CPC Class Codes: G01Q 60/52 Resonance
• CPC Class Codes: G01Q 70/18 Functionalisation
• CPC Class Codes: G01R 33/0385 in relation with magnetic force measurements magnetic force microscopes G01Q60/50
• CPC Class Codes: G01R 33/10 Plotting field distribution ; Measuring field distribution

Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Claims

1. A scanning magnetic microscope comprising:

an ultrasensitive micro-cantilever onto the free end of which is fixed a photoluminescent nanoprobe;

a sample of dilute paramagnetic particles exhibiting electron spins which is closely positioned, in the range of tens of nanometers, to said nanoprobe;

a permanent magnet placed nearby for inducing an external magnetic field upon said nanoprobe and said sample of dilute paramagnetic particles;

a radio frequency coil placed nearby for inducing an external radio frequency field upon said nanoprobe and said sample of dilute paramagnetic particles;

an optical fiber placed in close proximity to said nanoprobe for introducing an evanescent laser exciting light upon said nanoprobe at a frequency resonant with the transition between the magnetic sublevels of said nanoprobe; and

a detector, positioned at a 45 degree angle to said nanoprobe and said sample of dilute paramagnetic particles in both plan and elevation views, capable of optically recognizing the photoluminescent intensity of transition emissions given off by said nanoprobe when excited.

2. A scanning magnetic microscope of claim 1, wherein said radio frequency coil produces a field that is at a frequency resonant with the transition between the magnetic sublevels of said nanoprobe when said induced magnetic field is varied.

3. A scanning magnetic microscope of claim 1, wherein said radio frequency coil produces a field that is oscillating in the vicinity of the frequency resonant with the transition between the magnetic sublevels of said nanoprobe when said induced magnetic field is fixed.

4. A scanning magnetic microscope of claim 1 wherein said photoluminescent nanoprobe consists of a single fluorescent molecule.

5. A scanning magnetic microscope of claim 4, wherein said single fluorescent molecule is located in the apex of the (free end) tip.

6. A scanning magnetic microscope of claim 1, wherein said photoluminescent nanoprobe consists of semiconductor nanocrystals or dye molecules.

7. A scanning magnetic microscope of claim 1, wherein the proximate end of said optical fiber is conically tapered.

8. A scanning magnetic microscope of claim 4, which exhibits nanoscale lateral resolution and single electron spin sensitivity.

9. A scanning magnetic microscope of claim 1, wherein said sample of dilute paramagnetic particles is opaque.