Noncontact conductivity measuring instrument
First Claim
1. A measuring instrument for noncontact measurement of conductivity of a silicon wafer using a microwave, the measuring instrument comprising:
- an oscillator operating at a frequency not more than 100 GHz for oscillating the microwave;
a circulator connected to the oscillator;
a horn antenna connected to the circulator, the horn antenna transmitting the microwave to an upper surface of the silicon wafer and receiving a reflected wave from the upper surface of the silicon wafer;
a detector connected to said circulator, the detector outputting a voltage proportional to a square of magnitude of the wave from the upper surface of said silicon wafer; and
a computer for computing conductivity of said silicon wafer from said voltage.
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Abstract
The present invention relates to measurement of conductivity. A microwave oscillated by an oscillator using a Gunn diode is applied through an isolator, a circulator, and a horn antenna to a silicon wafer. The isolator is used for reducing the standing wave influencing the operation of the instrument. The reflected wave is received by the same horn antenna, detected by a detector connected to the circulator, and outpufted in the form of a voltage. The detector produces an output voltage proportional to the square of the amplitude of an electric field. Since the amplitude of the reflected wave from a silicon wafer is proportional to the absolute value of the reflectance, the output voltage is also proportional to the square of the absolute value of the reflectance. The reflectance is in a certain relationship with the conductivity, the conductivity of the silicon wafer can be determined.
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Citations
4 Claims
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1. A measuring instrument for noncontact measurement of conductivity of a silicon wafer using a microwave, the measuring instrument comprising:
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an oscillator operating at a frequency not more than 100 GHz for oscillating the microwave; a circulator connected to the oscillator; a horn antenna connected to the circulator, the horn antenna transmitting the microwave to an upper surface of the silicon wafer and receiving a reflected wave from the upper surface of the silicon wafer; a detector connected to said circulator, the detector outputting a voltage proportional to a square of magnitude of the wave from the upper surface of said silicon wafer; and a computer for computing conductivity of said silicon wafer from said voltage. - View Dependent Claims (2, 3, 4)
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Specification
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- Resources
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Current AssigneeTohoku Techno Arch Co., Ltd.
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Original AssigneeTohoku Techno Arch Co., Ltd.
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InventorsJu, Yang
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Primary Examiner(s)Benson, Walter
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Application NumberUS10/559,921Publication NumberTime in Patent Office1,138 DaysField of Search324/637, 324/639US Class Current324/637CPC Class CodesG01R 27/04 in circuits having distribu...G01R 31/2648 Characterising semiconducto...
