Annular potentiometric touch sensor
First Claim
1. An annular touch sensor comprising:
- a bottom substrate;
an annular pattern of resistive material on a top surface of the bottom substrate;
a plurality of conductive drive lines, each conductive drive line radially traversing the annular pattern of resistive material so as to make electrical connection with the annular pattern of resistive material;
a top substrate spaced above the top surface of the bottom substrate; and
a conductive sense layer on a bottom surface of the top substrate, the conductive sense layer positioned above the annular pattern of resistive material;
whereby pressure applied to either the top substrate or the bottom substrate causes a portion of the conductive sense layer to contact a corresponding portion of the annular pattern of resistive material thus permitting the angular position of the applied pressure to be determined by measuring at least one electrical parameter between at least one of the conductive drive lines and the conductive sense layer.
3 Assignments
0 Petitions
Accused Products
Abstract
The present invention determines angular position using a potentiometric touch sensor. The sensor has an annular pattern of resistive material on a bottom substrate top surface. Conductive drive lines radially traverse the resistive material so as to make electrical connection with the resistive material. A top substrate is spaced above the top surface of the bottom substrate. A conductive sense layer on a bottom surface of the top substrate is positioned above the resistive material. Pressure applied to either the top substrate or the bottom substrate, such as by the touch of a user, causes a portion of the conductive sense layer to contact a corresponding portion of the annular pattern of resistive material. The angular position of the applied pressure can be determined by measuring at least one electrical parameter between at least one of the conductive drive lines and the conductive sense layer.
-
Citations
15 Claims
-
1. An annular touch sensor comprising:
-
a bottom substrate; an annular pattern of resistive material on a top surface of the bottom substrate; a plurality of conductive drive lines, each conductive drive line radially traversing the annular pattern of resistive material so as to make electrical connection with the annular pattern of resistive material; a top substrate spaced above the top surface of the bottom substrate; and a conductive sense layer on a bottom surface of the top substrate, the conductive sense layer positioned above the annular pattern of resistive material; whereby pressure applied to either the top substrate or the bottom substrate causes a portion of the conductive sense layer to contact a corresponding portion of the annular pattern of resistive material thus permitting the angular position of the applied pressure to be determined by measuring at least one electrical parameter between at least one of the conductive drive lines and the conductive sense layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. A method of determining angular position on a touch sensor comprising:
-
applying a first test voltage between a first conductive trace intersecting an annular pattern of resistive material and a second conductive trace intersecting the annular pattern of resistive material; determining a first measured voltage between the first conductive trace and a conductive sense layer brought into contact with the annular pattern of resistive material by pressure applied at the angular position to be determined; applying a second test voltage between the second conductive trace and the first conductive trace; determining a second measured voltage between the second conductive trace and the conductive sense layer; and determining the angular position based on the first measured voltage and the second measured voltage. - View Dependent Claims (13, 14)
-
-
15. A method of determining angular position on a touch sensor comprising:
-
applying a first test voltage between a first conductive trace intersecting an annular pattern of resistive material and a second conductive trace intersecting the annular pattern of resistive material; determining a first measured voltage between a conductive sense layer and either the first conductive trace or the second conductive trace, the conductive sense layer brought into contact with the annular pattern of resistive material by pressure applied at the angular position to be determined; applying a second test voltage between the first conductive trace and a third conductive trace intersecting the annular pattern of resistive material; determining a second measured voltage between the conductive sense layer and either the first conductive trace or the third conductive trace; and determining the angular position based on the first measured voltage and the second measured voltage.
-
Specification