Anchors for microelectromechanical systems having an SOI substrate, and method of fabricating same
First Claim
1. A microelectromechanical device comprising:
- a substrate;
an insulation layer disposed on the substrate;
a first semiconductor layer disposed on or above the insulation layer;
an anchor that is disposed in an opening in the insulation layer and the first semiconductor layer and contacts the substrate, wherein the anchor includes a material that is different from the insulation layer;
a second semiconductor layer disposed on the anchor;
a fixed electrode, formed, in part, from the first and second semiconductor layers, wherein the fixed electrode is affixed to the substrate via the anchor;
a moveable electrode, formed, in part, from the second semiconductor layer, wherein the moveable electrode is disposed, at least in part, in a chamber;
a first encapsulation layer disposed over the moveable electrode, wherein the first encapsulation layer is at least a portion of a wall of the chamber; and
a second encapsulation layer, deposited on the first encapsulation layer, to seal the chamber.
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Abstract
There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a MEMS device, and technique of fabricating or manufacturing a MEMS device having mechanical structures and anchors to secure the mechanical structures to the substrate. The anchors of the present invention are comprised of a material that is relatively unaffected by the release processes of the mechanical structures. In this regard, the etch release process are selective or preferential to the material(s) securing the mechanical structures in relation to the material comprising the anchors. Moreover, the anchors of the present invention are secured to the substrate in such a manner that removal of the insulation layer has little to no affect on the anchoring of the mechanical structures to the substrate.
260 Citations
34 Claims
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1. A microelectromechanical device comprising:
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a substrate; an insulation layer disposed on the substrate; a first semiconductor layer disposed on or above the insulation layer; an anchor that is disposed in an opening in the insulation layer and the first semiconductor layer and contacts the substrate, wherein the anchor includes a material that is different from the insulation layer; a second semiconductor layer disposed on the anchor; a fixed electrode, formed, in part, from the first and second semiconductor layers, wherein the fixed electrode is affixed to the substrate via the anchor; a moveable electrode, formed, in part, from the second semiconductor layer, wherein the moveable electrode is disposed, at least in part, in a chamber; a first encapsulation layer disposed over the moveable electrode, wherein the first encapsulation layer is at least a portion of a wall of the chamber; and a second encapsulation layer, deposited on the first encapsulation layer, to seal the chamber. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A microelectromechanical device comprising:
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a substrate; an insulation layer disposed on the substrate; a first semiconductor layer disposed on or above the insulation layer; an anchor that is disposed in an opening in the insulation layer and the first semiconductor layer and contacts the substrate, wherein the anchor includes a material that is different from the insulation layer; a second semiconductor layer disposed on the anchor and on the first semiconductor layer; a fixed electrode, formed, in part, from the first and second semiconductor layers, wherein the fixed electrode is affixed to the substrate via the anchor; a moveable electrode, formed, in part, from the second semiconductor layer, wherein the moveable electrode is disposed, at least in part, in a chamber; a first encapsulation layer, disposed over at a portion of the moveable electrode, wherein the first encapsulation layer is at least a portion of a wall of the chamber; and a second encapsulation layer, deposited on the first encapsulation layer, to seal the chamber, wherein the second encapsulation layer includes a semiconductor material. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A microelectromechanical device comprising:
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a substrate; an insulation layer disposed on the substrate; a first semiconductor layer disposed on or above the insulation layer; an anchor that is disposed in an opening in the insulation layer and the first semiconductor layer and contacts the substrate, wherein the anchor includes a material that is different from the insulation layer; a second semiconductor layer, disposed on the anchor; a fixed electrode, formed, in part, from the second semiconductor layer, wherein the fixed electrode is affixed to the substrate via the anchor; a moveable electrode, formed, in part, from the second semiconductor layer, wherein the moveable electrode is disposed, at least in part, in a chamber; a first encapsulation layer, disposed over at least a portion of the moveable electrode, wherein the first encapsulation layer is at least a portion of a wall of the chamber; and a second encapsulation layer, deposited on the first encapsulation layer, to seal the chamber, wherein the second encapsulation layer includes a semiconductor material. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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Specification