Particle detection method
First Claim
1. A method for detecting a particle on a substrate, wherein the substrate is used in the fabrication of an integrated device, the method comprising:
- contacting the integrated-device substrate with a monomer, wherein a particle that catalyzes the polymerization of the monomer is disposed on the substrate, anddetecting the particle using a particle counter.
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Accused Products
Abstract
A method for detecting on a substrate used in the fabrication of integrated devices comprises the steps of (1) contacting the substrate with a monomer, wherein the particle catalyzes the polymerization of the monomer, and (2) detecting the particle using a particle counter. Different types of particles may be distinguished through their different polymerization rates of the monomer. Accordingly, in some certain embodiments, steps (1) and (2) may be repeated, allowing the growth rates of the particles to be determined. A plurality of monomers may be employed to identify different types of particles on the same substrate. The method is useful in detecting copper particles on silicon substrates.
25 Citations
24 Claims
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1. A method for detecting a particle on a substrate, wherein the substrate is used in the fabrication of an integrated device, the method comprising:
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contacting the integrated-device substrate with a monomer, wherein a particle that catalyzes the polymerization of the monomer is disposed on the substrate, and detecting the particle using a particle counter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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Specification