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Circuit interrupting device with automatic end of life test

  • US 7,317,600 B2
  • Filed: 05/22/2006
  • Issued: 01/08/2008
  • Est. Priority Date: 02/25/2005
  • Status: Expired due to Fees
First Claim
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1. A circuit interrupting device comprising:

  • a test circuit which automatically generates a simulated leakage current to test components of said circuit interrupting device;

    wherein said test circuit comprises an end-of-service-life detecting integrated circuit chip; and

    wherein said end-of-service-life detecting integrated circuit chip is connected to a switch which interacts with a reset button;

    whereby when said circuit interrupting device is powered and said circuit interrupting device is in a tripped state, if all of said components of said circuit interrupting device are working properly, said test circuit allows said circuit interrupting device to be reset;

    whereby when said circuit interrupting device is powered and said circuit interrupting device is in a tripped state, if at least one of said components of said circuit interrupting device is not working properly, said test circuit prevents said circuit interrupting device from being reset;

    whereby when said circuit interrupting device is in a tripped state, said switch is conductive which sends a signal to said end-of-service life detecting integrated circuit chip to generate a simulated leakage current to test said components of said circuit interrupting device;

    whereby when all of said components of said circuit interrupting device are working properly, said reset button is capable of being reset; and

    whereby when at least one of said components of said circuit interrupting device is not working properly, said reset button is not capable of being reset.

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