Charged particle beam device probe operation
First Claim
1. An apparatus, comprising:
- a positioner controller configured to control positioning of at least one of a device under test (DUT) and a probe within a chamber of a charged particle beam device (CPBD), including positioning control by at least partial automation of at least one of;
orientation of the DUT within the CPBD chamber for examination of the DUT within the CPBD chamber;
orientation of the probe within the CPBD chamber for examination of at least one of the probe and the DUT; and
relative orientation of the probe and the DUT for establishing contact between the probe and the DUT within the CPBD chamber; and
storage structure configured to;
store at least one end-effector within the CPBD chamber, wherein the probe is an examination probe and the end-effector includes the examination probe and an assembly probe extending in opposing directions, wherein the assembly probe is configured to couple with a positioner; and
release the at least one end-effector upon connection between the assembly probe and a corresponding assembly socket of the positioner.
6 Assignments
0 Petitions
Accused Products
Abstract
An apparatus including a positioner control device, a measuring device and a control routine. The positioner control device is communicatively coupled to a chamber of a charged particle beam device (CPBD) and is configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber. The measuring device is communicatively coupled to the CPBD and the positioner control device and is configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points. The control routine is configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device.
137 Citations
19 Claims
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1. An apparatus, comprising:
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a positioner controller configured to control positioning of at least one of a device under test (DUT) and a probe within a chamber of a charged particle beam device (CPBD), including positioning control by at least partial automation of at least one of; orientation of the DUT within the CPBD chamber for examination of the DUT within the CPBD chamber; orientation of the probe within the CPBD chamber for examination of at least one of the probe and the DUT; and relative orientation of the probe and the DUT for establishing contact between the probe and the DUT within the CPBD chamber; and storage structure configured to; store at least one end-effector within the CPBD chamber, wherein the probe is an examination probe and the end-effector includes the examination probe and an assembly probe extending in opposing directions, wherein the assembly probe is configured to couple with a positioner; and release the at least one end-effector upon connection between the assembly probe and a corresponding assembly socket of the positioner. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An apparatus, comprising:
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a positioner control device communicatively coupled to a chamber of a charged particle beam device (CPBD) and configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber; a measuring device communicatively coupled to the CPBD and the positioner control device and configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points; and a control routine configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device; wherein the control routine is configured to at least partially automate control of a plurality of processes including; selection of one of the plurality of probes for use in the measurement or detection of the characteristic; ex-situ preparation of at least one of the plurality of probes; ex-situ conditioning of at least one of the plurality of probes; ex-situ characterization of at least one of the plurality of probes; in-situ preparation of at least one of the plurality of probes; in-situ conditioning of at least one of the plurality of probes; in-situ characterization of at least one of the plurality of probes; ex-situ preparation of the sample; ex-situ conditioning of the sample; ex-situ characterization of the sample; in-situ preparation of the sample; in-situ conditioning of the sample; in-situ characterization of the sample; identification of at least one of the plurality of probes in an image created from data generated by the CPBD; translation of at least one of the plurality of probes relative to the sample; establishment of contact between at least one of the plurality of probes and at least one of the plurality of contact points; measurement of the characteristic; detection of the characteristic; and replacement of at least one of the plurality of probes. - View Dependent Claims (11)
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12. An apparatus for measuring a characteristic of a device under test (DUT) within a chamber of a charged particle beam device (CPBD), comprising:
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a base configured to mechanically couple to the CPBD chamber; a plurality of manipulator modules each coupled to the base; a plurality of probes detachably coupled to corresponding ones of the plurality of manipulator modules; a stage coupled to the base and configured to receive the DUT; and a positioner controller configured to control positioning of the plurality of probes relative to the DUT within the CPBD by communicating with the plurality of manipulator modules; and
a storage structure configured to store an end-effector within the CPBD chamber, wherein one of the plurality of probes is an examination probe and the end-effector includes the examination probe and an assembly probe extending in opposing directions, wherein the assembly probe is configured to couple with one of the plurality of manipulator modules. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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Specification