Systems and methods for in situ spectroscopic measurements
First Claim
1. An apparatus for measuring optical absorbance, comprising:
- i) a tip section comprising a first light source and a first detector, wherein the first light source emits a first light beam at a first wavelength across a first optical gap towards the first detector, such that the first detector receives the first light beam after the first light beam passes through the first optical gap and generates a first signal representative of the light received at the first detector;
ii) an aperture positioned between the first light source and the first optical gap which aperture substantially prevent light from the first light source from reaching the first detector via a path through that portion of the tip section that is external to the first optical gap; and
iii) a processor coupled to the first detector to determine an absorbance based on the first signal.
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Accused Products
Abstract
A circularizated semiconductor laser diode (CSLD), such as for example a vertical cavity surface emitting laser (VCSEL) may be used for optical measurements. The CSLD may be used in a cell density probe to perform cell density determination and/or turbidity determination, such as in a biotech, fermentation, or other optical absorbance application. The cell density probe may comprise a probe tip section made from a polytetrafluoroethylene material, which provides sealability, ease of manufacture, durability, cleanability, optical semi-transparency at visible and near infrared wavelengths, and other advantages. The probe tip advantageously provides an optical gap that allows for in situ measurements of optical measurements including but not limited to absorbance, scattering, and fluorescence.
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Citations
23 Claims
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1. An apparatus for measuring optical absorbance, comprising:
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i) a tip section comprising a first light source and a first detector, wherein the first light source emits a first light beam at a first wavelength across a first optical gap towards the first detector, such that the first detector receives the first light beam after the first light beam passes through the first optical gap and generates a first signal representative of the light received at the first detector; ii) an aperture positioned between the first light source and the first optical gap which aperture substantially prevent light from the first light source from reaching the first detector via a path through that portion of the tip section that is external to the first optical gap; and iii) a processor coupled to the first detector to determine an absorbance based on the first signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. An apparatus for making fluorescent measurements comprising:
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i) a tip section comprising a first light source and a first detector, wherein the first light source emits a first light beam at a first wavelength across a first optical gap which first beam is incident on a sample present in said first optical gap, such that the first detector receives fluorescent emissions occurring in the sample as a result of the incident light; ii) an aperture positioned between the first light source and the first optical gap which aperture substantially prevent light from the first light source from reaching the first detector via a path through that portion of the tip section that is external to the first optical gap; and iii) a processor coupled to the first detector to analyze the fluorescent emissions occurring in the sample as a result of the incident light. - View Dependent Claims (19, 20, 22, 23)
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21. An apparatus for making scattering measurements comprising:
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i) a tip section comprising a first light source and a first detector, wherein the first light source emits a first light beam at a first wavelength across a first optical gap which first beam is incident on a sample present in said first optical gap, such that the first detector receives light scattered by the sample as a result of the incident light; ii) an aperture positioned between the first light source and the first optical gap which aperture substantially prevent light from the first light source from reaching the first detector via a path through that portion of the tip section that is external to the first optical gap; and iii) a processor coupled to the first detector to analyze the light scattered by the sample as a result of the incident light.
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Specification