Resistive test probe tips and applications therefor

• US 7,321,234 B2
• Filed: 03/19/2007
• Issued: 01/22/2008
• Est. Priority Date: 12/18/2003
• Status: Active Grant

• Current Assignee: Teledyne LeCroy, Inc. (Teledyne Technologies Incorporated)
• Original Assignee: Lecroy Corporation (Teledyne Technologies Incorporated)
• Inventors: Jacobs, Lawrence W., Campbell, Julie A.
• Primary Examiner(s): Nguyen; Ha Tran
• Assistant Examiner(s): ISLA RODAS, RICHARD
• Application Number:
  US11/725,736
• Publication Number:
  US 20070229099A1
• Time in Patent Office: 309 Days
• Field of Search: 324/754
• US Class Current: 324/755.01
• CPC Class Codes: G01R 1/06755 Material aspects
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe tip has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally-extending resistive/conductive members or a plurality of particulate resistive/conductive members.

Claims

1. A test probe tip or contact comprising:

(a) resistive material having a resistance described by the equation R₁=0.75×

(√

(L₁/(C₁×

Length)) where R₁ is the resistance, L₁ is the inductance, and C₁ is the capacitance per millimeter;

(b) said test probe tip or contact constructed substantially from said resistive material, said test probe tip comprising;

(i) a probing end for probing electronic circuitry; and

(ii) a connection end for interfacing with a probing head; and

(c) said resistive material forming at least one electrical path from said probing end to said connection end.

2. The test probe tip or contact of claim 1 wherein said resistive material is nonmetallic.

3. The test probe tip or contact of claim 1 wherein said resistive material is pultruded resistive material.

4. The test probe tip or contact of claim 1 wherein said resistive material is pultruded rod.

5. The test probe tip or contact of claim 1 wherein said test probe tip or contact is a molded test probe tip or contact.

6. The test probe tip or contact of claim 1 wherein said test probe tip is constructed entirely of said resistive material.

7. The test probe tip or contact of claim 1, said resistive material having a longitudinal axis, said resistive material comprising:

(a) a plurality of longitudinally-extending resistive/conductive members, at least one resistive/conductive member having a first resistive/conductive member end and a second resistive/conductive member end;

(b) encapsulating material enclosing said plurality of longitudinally-extending resistive/conductive member; and

(c) said first resistive/conductive member end and said second resistive/conductive member end exposed from said encapsulating material to provide electrical contacts.

8. The test probe tip or contact of claim 7 wherein said encapsulating material is nonconductive encapsulating material.

9. The test probe tip or contact of claim 7 wherein said plurality of longitudinally-extending resistive/conductive members are conductive fiber elements.

10. The test probe tip or contact of claim 7 wherein said plurality of longitudinally-extending resistive/conductive members is a plurality of nonmetallic longitudinally-extending resistive/conductive members.

11. The test probe tip or contact of claim 1 wherein said resistive conducting material includes a plurality of conductive fiber elements.

12. The test probe tip or contact of claim 11 wherein said plurality of conductive fiber elements is a plurality of nonmetallic conductive fiber elements.

13. The test probe tip or contact of claim 1 wherein said resistive conducting material includes a plurality of conductive fiber elements, wherein said plurality of conductive fiber elements is made from a material selected from the group consisting of:

(a) carbon;

(b) carbon/graphite;

(c) nichrome; and

(d) graphite.

14. The test probe tip or contact of claim 1 wherein said resistive conducting material includes, wherein said encapsulating material is made from a material selected from the group consisting of:

(a) a polymer;

(b) structural thermoplastic;

(c) thermosetting resins;

(d) polyesters;

(e) epoxies;

(f) vinyl esters;

(g) polyetheretherketones;

(h) polyetherimides;

(i) polyethersulphones;

(j) polypropylene;

(k) nylon;

(l) an elastomeric matrix;

(m) a silicone;

(n) fluorosilicone; and

(o) polyurethane elastomer.

15. The test probe tip or contact of claim 1, wherein said resistive material includes a plurality of longitudinally-extending resistive/conductive members.

16. The test probe tip or contact of claim 15 wherein said plurality of longitudinally-extending resistive/conductive members is a plurality of nonmetallic longitudinally-extending resistive/conductive members.

17. The test probe tip or contact of claim 1, wherein said resistive material includes a plurality of particulate resistive/conductive members.

18. The test probe tip or contact of claim 17 wherein said plurality of particulate resistive/conductive members is a plurality of nonmetallic particulate resistive/conductive members.