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Resistive test probe tips and applications therefor

  • US 7,321,234 B2
  • Filed: 03/19/2007
  • Issued: 01/22/2008
  • Est. Priority Date: 12/18/2003
  • Status: Active Grant
First Claim
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1. A test probe tip or contact comprising:

  • (a) resistive material having a resistance described by the equation R1=0.75×

    (√

    (L1/(C1×

    Length)) where R1 is the resistance, L1 is the inductance, and C1 is the capacitance per millimeter;

    (b) said test probe tip or contact constructed substantially from said resistive material, said test probe tip comprising;

    (i) a probing end for probing electronic circuitry; and

    (ii) a connection end for interfacing with a probing head; and

    (c) said resistive material forming at least one electrical path from said probing end to said connection end.

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