Product framework for managing test systems, supporting customer relationships management and protecting intellectual knowledge in a manufacturing testing environment
First Claim
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1. An apparatus, comprising:
- a test system knowledge base having a test plan and test resource database for storing test plans, and corresponding test resource configuration data, for configuring a plurality of printed circuit board assembly testers to test at least one printed circuit board assembly; and
a central test information controller configured to receive requests for the test plans from the plurality of testers and to provide the respective requested test plans, and corresponding test resource configuration data, to each of the requesting respective testers.
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Abstract
A software framework for centralizing the management of test plans, test configurations, test sources, debug information for testing electrical devices in a manufacturing testing environment is presented. A three-tier software architecture is defined that allows one-time effort and segregation of tasks related to integration of hardware devices, development of multiple applications, and testing of multiple applications.
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Citations
15 Claims
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1. An apparatus, comprising:
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a test system knowledge base having a test plan and test resource database for storing test plans, and corresponding test resource configuration data, for configuring a plurality of printed circuit board assembly testers to test at least one printed circuit board assembly; and a central test information controller configured to receive requests for the test plans from the plurality of testers and to provide the respective requested test plans, and corresponding test resource configuration data, to each of the requesting respective testers. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A test system, comprising:
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a plurality of printed circuit board assembly testers; a knowledge database having a test plan and test resource database for storing test plans, and corresponding test resource configuration data, for configuring the testers to test at least one printed circuit board assembly; and a central test information controller configured to receive requests for the test plans from the plurality of testers and to provide the respective requested test plans, and corresponding test resource configuration data, to each of the requesting testers, the central test information controller operating as a single point of contact between the testers and the knowledge database. - View Dependent Claims (10, 11, 12, 13)
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14. A method for centralizing test system knowledge, the method comprising the steps of:
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storing test system knowledge, including test plans and corresponding test resource configuration data for configuring a plurality of printed circuit board assembly testers to test at least one printed circuit board assembly, in a centralized test system knowledge base; receiving, at a central test information controller, requests for the test plans from a plurality of printed circuit board assembly testers; and in response to the requests for the test plans, respectively providing to the testers, via the central test information controller, the requested test plans, and corresponding test resource configuration data.
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15. A test system, comprising:
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a plurality of printed circuit board assembly testers; a knowledge base having a measurement data and/or statistics database storing information related to measurement data and/or statistics collected from the testers; and a central test information controller comprising a measurement data and/or statistics controller that receives measurement data from the testers and controls storage and retrieval of the information related to measurement data and/or statistics in the measurement data and/or statistics database.
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Specification